热蒸发退火对不同温度下硒化银薄膜物理性能的影响

Hiba Mumtaz
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引用次数: 1

摘要

本研究研究了Ag2Se在不同热退火温度(300、348、398和448)K下在玻璃基板上的热蒸发。为了确定退火温度对Ag2Se薄膜结构、表面形貌和光学性能的影响,进行了调查和研究。用x射线衍射和其他方法描述了薄膜的晶体结构。ThephysicalstructureandcharacteristicsoftheAg2Sethinfilms wereexaminedusingX-rayandatomicforcemicroscopy basedtechniques (AFM)。采用原子力显微镜(AFM)技术对ag2se薄膜表面形貌进行了检测;研究得到了平均直径、表面粗糙度和晶粒尺寸随退火温度升高的变异值(75.74 nm ~ 96.36 nm)。此外,根据标称值的不同变化,进一步研究并报道了在(400-1100)nm波长范围内的吸收光谱和透射光谱。结果表明,样品在448 K时吸光度最高,而在300 K时透射率最高。结果表明,在光能分别为(2.15,1.85,1.75和1.7)eV的情况下,薄膜可以发生直接跃迁
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence Annealing on the Physical Properties of Silver Selenide Thin Film at Different Temperatures by Thermal Evaporation
This survey investigates the thermal evaporation of Ag2Se on glass substrates at various thermalannealing temperatures (300, 348, 398, and 448) °K. To ascertain the effect of annealingtemperature on the structural, surface morphology, and optical properties of Ag2Se films,investigations and research were carried out. The crystal structure of the film was described by Xraydiffractionandothermethods.ThephysicalstructureandcharacteristicsoftheAg2Sethinfilms wereexaminedusingX-rayandatomicforcemicroscopy(AFM)basedtechniques.TheAg2Se films surface morphology was examined by AFM techniques; the investigation gave averagediameter, surface roughness, and grain size mutation values with increasing annealing temperature(75.74 nm–96.36 nm). Additionally, With various variations to the nominal values, the absorbanceand transmittance spectra are further studied and reported in accordance with the wavelength rangeof (400-1100) nm. The findings indicate that the sample highest absorbance value was attained ata temperature treatment of 448 K, whereas the sample highest transmittance was at a temperaturetreatment of 300 K. According to the results, direct transitions were permitted in the under-reviewthin films at optical energies of (2.15, 1.85, 1.75, and 1.7) eV, respectively
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