{"title":"NiMn2O4薄膜的制备与表征","authors":"R. Schmidt, A.W. Brinkman","doi":"10.1016/S1466-6049(01)00131-3","DOIUrl":null,"url":null,"abstract":"<div><p><span>Thin films of NiMn</span><sub>2</sub>O<sub>4</sub><span> NTC thermistor material were produced by electron-beam-evaporation from phase pure NiMn</span><sub>2</sub>O<sub>4</sub> source material. The films were characterised using SEM, EDAX, XRD and an Alpha-Step stylus profileometer. Resistance vs. temperature characteristics were obtained over a wide range of temperature and suggested that the conduction mechanism was by variable range hopping. A theoretical model for the thickness profile of the films was derived and comparison of theory with experimental findings showed good agreement.</p></div>","PeriodicalId":100700,"journal":{"name":"International Journal of Inorganic Materials","volume":"3 8","pages":"Pages 1215-1217"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/S1466-6049(01)00131-3","citationCount":"33","resultStr":"{\"title\":\"Preparation and characterisation of NiMn2O4 films\",\"authors\":\"R. Schmidt, A.W. Brinkman\",\"doi\":\"10.1016/S1466-6049(01)00131-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p><span>Thin films of NiMn</span><sub>2</sub>O<sub>4</sub><span> NTC thermistor material were produced by electron-beam-evaporation from phase pure NiMn</span><sub>2</sub>O<sub>4</sub> source material. The films were characterised using SEM, EDAX, XRD and an Alpha-Step stylus profileometer. Resistance vs. temperature characteristics were obtained over a wide range of temperature and suggested that the conduction mechanism was by variable range hopping. A theoretical model for the thickness profile of the films was derived and comparison of theory with experimental findings showed good agreement.</p></div>\",\"PeriodicalId\":100700,\"journal\":{\"name\":\"International Journal of Inorganic Materials\",\"volume\":\"3 8\",\"pages\":\"Pages 1215-1217\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/S1466-6049(01)00131-3\",\"citationCount\":\"33\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Inorganic Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1466604901001313\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Inorganic Materials","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1466604901001313","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thin films of NiMn2O4 NTC thermistor material were produced by electron-beam-evaporation from phase pure NiMn2O4 source material. The films were characterised using SEM, EDAX, XRD and an Alpha-Step stylus profileometer. Resistance vs. temperature characteristics were obtained over a wide range of temperature and suggested that the conduction mechanism was by variable range hopping. A theoretical model for the thickness profile of the films was derived and comparison of theory with experimental findings showed good agreement.
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