Jumpei Nitta, Shoichi Kishimoto, Y. Taguchi, T. Saiki, Y. Nagasaka
{"title":"纳米尺度近场偏振旋转测温方法的实验研究","authors":"Jumpei Nitta, Shoichi Kishimoto, Y. Taguchi, T. Saiki, Y. Nagasaka","doi":"10.1109/OMN.2013.6659049","DOIUrl":null,"url":null,"abstract":"A novel nanoscale temperature measurement system using polarized near-field light which enables the high spatial resolution at nanoscale has been developed. In this measurement system, the temperature dependence of the rotation of the polarization plane in near field is detected. However, the signal light variation is extremely weak, therefore, more sensitive measurement system is required. In this paper, we proposed a novel high sensitive nanoscale temperature measurement method. In addition, this paper reports the analytical and experimental results by using platinum nanostructures in order to confirm the validity of the measurement principle.","PeriodicalId":6334,"journal":{"name":"2013 International Conference on Optical MEMS and Nanophotonics (OMN)","volume":"19 1","pages":"41-42"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Experimental study on nanoscale temperature measurement method using rotation of near-field polarization\",\"authors\":\"Jumpei Nitta, Shoichi Kishimoto, Y. Taguchi, T. Saiki, Y. Nagasaka\",\"doi\":\"10.1109/OMN.2013.6659049\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel nanoscale temperature measurement system using polarized near-field light which enables the high spatial resolution at nanoscale has been developed. In this measurement system, the temperature dependence of the rotation of the polarization plane in near field is detected. However, the signal light variation is extremely weak, therefore, more sensitive measurement system is required. In this paper, we proposed a novel high sensitive nanoscale temperature measurement method. In addition, this paper reports the analytical and experimental results by using platinum nanostructures in order to confirm the validity of the measurement principle.\",\"PeriodicalId\":6334,\"journal\":{\"name\":\"2013 International Conference on Optical MEMS and Nanophotonics (OMN)\",\"volume\":\"19 1\",\"pages\":\"41-42\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 International Conference on Optical MEMS and Nanophotonics (OMN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OMN.2013.6659049\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Conference on Optical MEMS and Nanophotonics (OMN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OMN.2013.6659049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experimental study on nanoscale temperature measurement method using rotation of near-field polarization
A novel nanoscale temperature measurement system using polarized near-field light which enables the high spatial resolution at nanoscale has been developed. In this measurement system, the temperature dependence of the rotation of the polarization plane in near field is detected. However, the signal light variation is extremely weak, therefore, more sensitive measurement system is required. In this paper, we proposed a novel high sensitive nanoscale temperature measurement method. In addition, this paper reports the analytical and experimental results by using platinum nanostructures in order to confirm the validity of the measurement principle.