利用无分布重叠系数控制超声换能器的质量

M. Angerer, M. Zapf, M. Koch, N. Ruiter
{"title":"利用无分布重叠系数控制超声换能器的质量","authors":"M. Angerer, M. Zapf, M. Koch, N. Ruiter","doi":"10.1109/SENSORS47087.2021.9639520","DOIUrl":null,"url":null,"abstract":"Ultrasound tomography for breast cancer imaging relies on high quantities of transducers. These should exhibit reliable performance, low variability and high production yield. This work aims for finding a suitable quality control method to identify manufacturing errors of ultrasound transducer arrays. Electromechanical impedance measurements were performed at five states during the array manufacturing process. Ten parameter were derived from each measurement at each state. The relative change of these parameters allows to evaluate their suitability for quality control. Suitable parameters must exhibit high sensitivity to changes in manufacturing, but low sensitivity to parasitic circuit elements. To quantify the separability, overlapping coefficients were calculated for each parameter between the current and the preceding manufacturing state. These coefficients reflect the intersecting area of two probability density functions which were calculated using a normal kernel function to avoid distributional assumptions. The bandwidth of the electrical input power was found the most suitable parameter for quality control. Identification of manufacturing defects is possible with a probability of 0.006 for false negative decisions. Additionally, it shows high overlapping coefficients when adding parasitic circuit elements. These results encouraged us to use the derived classifiers from easy-to-perform electromechanical impedance measurements for quality control of our ultrasonic transducer arrays.","PeriodicalId":6775,"journal":{"name":"2021 IEEE Sensors","volume":"10 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Quality Control of Ultrasound Transducers using distribution-free Overlapping Coefficients\",\"authors\":\"M. Angerer, M. Zapf, M. Koch, N. Ruiter\",\"doi\":\"10.1109/SENSORS47087.2021.9639520\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ultrasound tomography for breast cancer imaging relies on high quantities of transducers. These should exhibit reliable performance, low variability and high production yield. This work aims for finding a suitable quality control method to identify manufacturing errors of ultrasound transducer arrays. Electromechanical impedance measurements were performed at five states during the array manufacturing process. Ten parameter were derived from each measurement at each state. The relative change of these parameters allows to evaluate their suitability for quality control. Suitable parameters must exhibit high sensitivity to changes in manufacturing, but low sensitivity to parasitic circuit elements. To quantify the separability, overlapping coefficients were calculated for each parameter between the current and the preceding manufacturing state. These coefficients reflect the intersecting area of two probability density functions which were calculated using a normal kernel function to avoid distributional assumptions. The bandwidth of the electrical input power was found the most suitable parameter for quality control. Identification of manufacturing defects is possible with a probability of 0.006 for false negative decisions. Additionally, it shows high overlapping coefficients when adding parasitic circuit elements. These results encouraged us to use the derived classifiers from easy-to-perform electromechanical impedance measurements for quality control of our ultrasonic transducer arrays.\",\"PeriodicalId\":6775,\"journal\":{\"name\":\"2021 IEEE Sensors\",\"volume\":\"10 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE Sensors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SENSORS47087.2021.9639520\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Sensors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SENSORS47087.2021.9639520","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

用于乳腺癌成像的超声断层扫描依赖于大量的换能器。这些产品应具有可靠的性能、低变异性和高产量。本工作旨在寻找一种合适的质量控制方法来识别超声换能器阵列的制造误差。在阵列制造过程中进行了五种状态下的机电阻抗测量。从每个状态下的每次测量得到10个参数。这些参数的相对变化可以评价它们对质量控制的适用性。合适的参数必须对制造过程的变化具有高灵敏度,但对寄生电路元件的灵敏度较低。为了量化可分离性,计算了当前和先前制造状态之间每个参数的重叠系数。这些系数反映了两个概率密度函数的相交面积,这些函数使用正态核函数计算,以避免分布假设。发现输入功率的带宽是最适合质量控制的参数。制造缺陷的识别对于假阴性决策的概率为0.006是可能的。此外,当增加寄生电路元件时,其重叠系数较高。这些结果鼓励我们使用易于执行的机电阻抗测量衍生的分类器来控制超声波换能器阵列的质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Quality Control of Ultrasound Transducers using distribution-free Overlapping Coefficients
Ultrasound tomography for breast cancer imaging relies on high quantities of transducers. These should exhibit reliable performance, low variability and high production yield. This work aims for finding a suitable quality control method to identify manufacturing errors of ultrasound transducer arrays. Electromechanical impedance measurements were performed at five states during the array manufacturing process. Ten parameter were derived from each measurement at each state. The relative change of these parameters allows to evaluate their suitability for quality control. Suitable parameters must exhibit high sensitivity to changes in manufacturing, but low sensitivity to parasitic circuit elements. To quantify the separability, overlapping coefficients were calculated for each parameter between the current and the preceding manufacturing state. These coefficients reflect the intersecting area of two probability density functions which were calculated using a normal kernel function to avoid distributional assumptions. The bandwidth of the electrical input power was found the most suitable parameter for quality control. Identification of manufacturing defects is possible with a probability of 0.006 for false negative decisions. Additionally, it shows high overlapping coefficients when adding parasitic circuit elements. These results encouraged us to use the derived classifiers from easy-to-perform electromechanical impedance measurements for quality control of our ultrasonic transducer arrays.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信