铝结合线高周疲劳预测:一种结合实验和多物理场模拟的失效物理方法

J. Bielen, J.-J. Gommans, F. Theunis
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引用次数: 40

摘要

用于LDMOS的陶瓷气腔封装中的铝线键,由于温度和功率循环导致导线以周期性的方式膨胀和收缩,本质上容易产生机械疲劳。在一定的脉冲应用条件下,产品必须存活的电流循环量是如此之高,以至于不仅是由循环塑性变形引起的低周疲劳,而且高周疲劳也成为一个问题。本文介绍了如何在不同应力水平下的专用测试结构上进行现场监测功率循环实验,利用结合线的焦耳加热,在线圈形状和测试设置足够关键的情况下,在合理的测试时间内发现故障。由于鞋跟和楔子的塑性变形,不同的金属丝粘结设置会产生不同数量的初始损伤。采用有限元法计算了实验中键合丝跟部应力幅值随电流、脉冲时间和回路形状的变化规律。这需要多物理场方法,使用耦合电热和顺序耦合热力学模拟。为了定量考虑初始塑性应变,还利用二维有限元模拟估计了初始损伤量。利用实测的破坏次数(Nf)和计算的应力幅值(S),可以推导出不同初始损伤程度下的耐久性或S- n曲线,并用Basquin模型进行拟合。这些拟合模型用于预测特定现场条件下的预期寿命。此外,这些模型还可用于推导“可靠性设计规则”,以使线圈形状在特定用户配置文件中存活下来
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Prediction of high cycle fatigue in aluminum bond wires: A physics of failure approach combining experiments and multi-physics simulations
Aluminum wire bonds, as used in a ceramic air cavity package for LDMOS, will intrinsically be prone to mechanical fatigue due to temperature and power cycling causing the wires to expand and shrink in a cyclical way. Under certain pulsed application conditions, the required amount of current cycles the product must survive is so high that not just low cycle fatigue, caused by cyclic plastic deformation, but also high cycle fatigue becomes a concern. This paper describes how in-situ monitored power cycling experiments, using the Joule heating of the bond wires, were performed on dedicated test structures at different stress levels with wire loop shapes and test settings critical enough to find failures within reasonable test times. Wire bond settings were varied to create different amounts of initial damage as introduced by the plastic deformation of the heel and the wedge. Finite element method was employed to calculate the stress amplitude in the heel of the bond wire in the experiments as function of current, pulse time and loop shape. This required a multi-physics approach using coupled electro-thermal and sequentially coupled thermo-mechanical simulations. The amount of initial damage was also estimated, using 2D FE simulations, in order to quantitatively take into account the initial plastic strains. With the measured failure times (Nf) and calculated stress amplitude (S) the durability or S-N curves for different amounts of initial damage could be derived and fitted with the Basquin model. These fitted models were used to predict the expected lifetime for specified field conditions. Furthermore the models can be used to derive `design for reliability rules' for wire loop shapes that will survive a specified user profile
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