四量子位对称Dicke态的排列不变层析成像

2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference (CLEO EUROPE/EQEC) Pub Date : 2011-05-22 DOI:10.1109/CLEOE.2011.5943393

C. Schwemmer, G. Tóth, W. Wieczorek, D. Gross, R. Krischek, H. Weinfurter

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引用次数: 1

摘要

多部纠缠量子态在量子信息处理中发挥着重要作用，在量子增强计量、量子通信等领域具有广泛的应用。因此，需要有效的测量方案来充分表征这些状态。然而，传统的量子态断层扫描可以揭示量子态的所有特性，随着量子比特的数量，测量工作量呈指数级增长。

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Permutationally invariant tomography of a four-qubit symmetric Dicke state

Multi-partite entangled quantum states play an important role in quantum information processing with applications, for example, in quantum enhanced metrology or quantum communication. Therefore, efficient measurement schemes to fully characterize these states are needed. However, conventional quantum state tomography which reveals all properties of a quantum state suffers from an exponentially increasing measurement effort with the number of qubits.

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2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference (CLEO EUROPE/EQEC)

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