Applying Anand versus Garofalo creep constitutive models for simulating sintered silver die attachments in power electronics

This paper aims to examine the thermomechanical response of sintered silver die attachments in power electronics using finite element analysis (FEA). In this work, several material parameters of the sintered silver bonds are investigated. Additionally, two common solder creep constitutive laws including Anand and Garofalo models are also studied. To ensure the fidelity of the simulation procedures, the finite element (FE) models are first correlated with digital image correlation data. Afterward, the FE models are utilized to examine the influence of the material and creep models on the die attach stresses, strains, and plastic works. The expected fatigue and lifetime predictions of the sintered silver layer are thoroughly discussed, accordingly. The results proved that the die attach layer mechanical response is highly driven by the material parameters and creep modeling procedures considered throughout the simulations. Thus, the resulting fatigue life is evaluated. Finally, a general modeling guideline for simulating thermomechanical response of sintered silver die attachments in power electronics are provided in great detail.