BTJ-VCSEL电光分析的多尺度方法

Alberto Gullino, Simone Pecora, A. Tibaldi, F. Bertazzi, M. Goano, P. Debernardi
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引用次数: 0

摘要

本文从理论上比较了850nm GaAs/AlGaAs引脚和btj基vcsel的电光特性。计算是基于一个漂移-扩散模型与一个NEGF形式相结合,能够准确地模拟穿越TJ的隧道掘进。结果表明,在25°C和80°C下,通过TJ约束方案,LIV特性得到了有希望的改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A multiscale approach for BTJ-VCSEL electro-optical analysis
This paper presents a theoretical comparison of the electro-optical characteristics of 850nm GaAs/AlGaAs pin-and BTJ-based VCSELs. The calculations are based on a drift-diffusion model coupled with a NEGF formalism, able to model accurately the tunneling across the TJ. The resulting LIV characteristics demonstrate promising improvements, at both 25 and 80°C, enabled by TJ confinement scheme.
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