开发基于人工智能的模型(GUI/APP),能够预测纳米压痕过程中的载荷-位移曲线和AFM图像

R. Jha, A. Agarwal
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引用次数: 0

摘要

在纳米压痕试验中,载荷-位移曲线用于估计材料的力学性能,而原子力显微镜(AFM)获得的压痕图像用于研究材料的变形。我们提出了一个计算平台,用于开发基于人工智能的模型,用于预测压痕深度(载荷-位移曲线)和AFM图像,作为最大施加载荷、加载速率和保持时间等测试参数的函数。用户可以直接使用机器生成的文本(.txt)和分层数据格式(HDF, HDF)格式的数据分别开发基于ai的缩进深度模型和AFM图像模型。该软件在三种不同涂层/材料上进行了压痕深度测试:冷喷涂铝基大块金属玻璃(Al-BMG)涂层的热处理(HT)样品、碳纳米管增强铝复合材料(Al-5CNT)涂层和火花等离子烧结羟基磷灰石(SPS HA)样品。在AFM成像中,考虑了冷喷涂铝基大块金属玻璃(Al-BMG)涂层的热处理样品。在这项工作中开发的所有模型的相关或r值都接近1。预测的载荷-位移曲线和AFM图像与实验结果吻合较好。我们的方法将有助于大量新测试参数的载荷-位移曲线和AFM缩进图像的虚拟模拟,从而显着减少表征/分析材料所需的缩进数量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Software (GUI/APP) for Developing AI-Based Models Capable of Predicting Load-Displacement Curve and AFM Image during Nanoindentation
During nanoindentation tests, the load-displacement curve is used for estimating mechanical properties, while an indent image obtained through atomic force microscopy (AFM) is used for studying deformation of a material. We present a computational platform for developing artificial intelligence-based models for predicting indentation depth (load-displacement curve) and AFM image as a function of test parameters like maximum applied load, loading rate, and holding time. A user can directly use machine generated data in text (.txt) and hierarchical data format (HDF, hdf) format for developing the AI-based models for indentation depth and AFM image, respectively. The software was tested on three different coatings/materials for indentation depth: heat-treated (HT) sample of cold sprayed aluminum-based bulk metallic glass (Al-BMG) coating, carbon nanotube reinforced aluminum composite (Al-5CNT) coating, and spark-plasma-sintered hydroxyapatite (SPS HA) sample. For AFM imaging, a heat-treated (HT) sample of cold sprayed aluminum-based bulk metallic glass (Al-BMG) coating was considered. Correlation or R-values are close to 1 for all the models developed in this work. Predicted load-displacement curve and AFM image are in good agreement with the experimental findings. Our approach will be helpful in virtual simulation of load-displacement curves and AFM indent images for a large number of new test parameters, thus significantly reducing the number of indents needed for characterizing/analyzing a material.
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