气体流动对氦中大气压辉光放电的影响

H. Luo, Z. Liang, B. Lv, X. Wang, Z. Guan, L. Wang
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引用次数: 0

摘要

大气压辉光放电(APGD)在两个直径为50 mm的平面平行电极之间的5 mm氦气间隙中产生,每个电极由1 mm厚的石英石板覆盖。研究了氦气平行流过氦气隙对APGD的影响。氦气的流速最高可达每分钟12升,相当于氦气以67厘米/秒的速度流过5毫米× 60毫米的间隙横截面。随着氦气流速的增加,每半周期出现的放电电流脉冲向前移动。随着电流脉冲的相移,由测量的施加电压和放电电流推导出的氦隙击穿电压从1200 V降低到950 V。电流脉冲的幅值im和脉宽tw随氦气流速呈非单调变化,且在流速为1.4 cm/s时均有一个拐点。im从31 ~ 20 mA减小,然后缓慢增大到26 mA, tw从750 ~ 1350 ns增大,然后缓慢减小到900 ns左右。虽然im随流速变化的方式与tw相反,但通过对一个电流脉冲时间内的电流积分计算的转移电荷在不同流速下几乎保持恒定,这与介质阻挡作为电容器的概念是一致的。用曝光时间为20 ns的ICCD相机拍摄了放电间隙的侧面照片。与无氦流情况相比,有氦流情况下,由于放电电流较小,整个间隙内的放电光相对较弱。随着氦流速度的增加,正柱变短,法拉第暗空间变宽,这是氦流放电模式的一个明显变化。值得注意的是,随着氦流速的增加,氮分子离子第一负极体系的391.4 nm谱线越来越弱。众所周知,391.4 nm的谱线是氦亚稳态与氮杂质之间Penning电离的指示线。谱线的强度较低可能是由于氦气流动时放电间隙中的杂质较少。对于氦隙的击穿电压随氦气的流动而降低的原因,认为氦隙中亚稳态氦的杂质猝灭剂较少,导致了亚稳态氦寿命的延长。为了证实这一假设,制备了一个单色计和光电倍增管,用于测量391.4 nm的时间分辨谱线。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influences of gas flow on atmospheric pressure glow discharge in helium
Atmospheric pressure glow discharge (APGD) was produced in a 5-mm helium gap between two plane-parallel electrodes of 50 mm in diameter, each covered by a 1-mm thick quartz plate. The influence of the helium gas flowing in parallel through the helium gap on APGD was studied. The helium flow rate varies up to 12 liter per minute, corresponding to helium at a speed of 67 cm/s flowing through a 5 mm x 60 mm cross section of the gap. The discharge current pulse appearing per half cycle of the applied voltage shifts forward as the helium flow speed increases. In accord with this phase shifting of the current pulse, the breakdown voltage of the helium gap that was deduced from the measured applied voltage and discharge current decreases from 1200 V to 950 V. Both amplitude, im, and pulse width (FWHM), tw, of the current pulse vary non-monotonically with the helium flow speed and are with same an inflexion point at flow speed of 1.4 cm/s. While im decreases from 31 mA to 20 mA and then slowly increases to 26 mA, tw increases from 750 ns to 1350 ns and then slowly decreases to about 900 ns. Although im varies with the flow speed in a way contrary to that of tw, the transferred charge calculated by integrating current over the time of one current pulse keeps almost a constant for different flow speed, which is consistent with the concept that the dielectric barrier acting as a capacitor. The side-view photographs of the discharge gap were taken by an ICCD camera with an exposure time of 20 ns. Compared with that in the case without helium flow, the discharge light with helium flow is relatively weaker over entire gap due to smaller discharge current. A distinct change in the discharge pattern with helium flow is that positive column gets shorter and Faraday dark space gets wider as the flow speed increases. It is important to find that spectrum line of 391.4 nm from the first negative system of nitrogen molecular ions gets weaker and weaker with the increase of helium flow speed. As is well known that the spectrum line of 391.4 nm is an indicative of Penning ionization between helium metastables and nitrogen impurity. The lower intensity of the spectrum line may be attributed to less impurity in the discharge gap with helium flow. As for the reason why the breakdown voltage of the helium gap decreases with helium flow, it was assumed that longer lifetimes of helium metastables result from the less impurity, quenchers of helium metastables, in the gap. For confirmation of this assumption, a monochrometer coupled with a photomultiplier is being prepared for measuring the time-resolved spectrum line of 391.4 nm.
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