从实际案例分析金丝焊包的失效

Ander Hsieh, Mike Huang, Johnny Ch Chen, Michael Yeh
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引用次数: 0

摘要

本文介绍了一个与现场包装失效相关的实际案例,利用传统的设备(横断面、烘箱、扫描电镜)揭示了可能引发包装失效的混合因素中的两个。在最后的结论中,我们认为在现场使用1~1.5年的时间里,失效与金丝球与衬垫之间的裂纹和封装的凹成型密切相关。本文的另一个目的是希望引起业界对焊线质量标准的重视。现行标准只规定了焊线的拉拔强度,而没有对焊线的结构质量进行控制,电气性能连接不良可能导致电子产品暂时失效,且不容易找出失效的根本原因,这种情况可能影响到不同层次的产品,如军事、卫星、医疗仪器、航空工业、服务器、个人电脑等。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Failure Analysis for Package of Gold Wire Bonding from Practical Case
A practical case related to package failure from field was presented in this paper, traditional equipment (cross-section, oven, SEM) was used to reveal 2 of mixed factors that may trigger failure of package. In the final conclusion, we considered the failure was strongly related to crack between gold wire ball & pad and concave molding of package when using 1~1.5 years from field. Another purpose of this paper is that author would like to draw industry’s attention regarding to quality standard of wire bonding. In current standard only stated the pull strength of wire bonding, but it did not control the structure quality of wire bonding, bad connection of electrical property may result in temporal failure of electronic product and not easy to find out the root cause of failure, this situation may influence different level of product, e.g. military, satellite, medical instrument, air industry, server, personal computer.
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