{"title":"非晶Ni0.95Tb0.05和结晶镍的椭偏光谱分析","authors":"B.-Y. Yang, K. Vedam, P. Klosowski, J.S. Lannin","doi":"10.1016/0025-5416(88)90340-0","DOIUrl":null,"url":null,"abstract":"<div><p>Spectroscopic ellipsometry was used to determine the pseudodielectric constants of thin film sputtered crystalline nickel and the concentrated amorphous Ni<sub>0.95</sub>Tb<sub>0.05</sub> alloy. The variation in <em>ϵ</em><sub>2</sub>(<em>ω</em>)/<em>λ</em>, which indicates the matrix element weighted joint density of states, is found to be relatively similar for both crystalline and amorphous systems. This is interpreted in terms of related short-range order and similar d band states in both these materials.</p></div>","PeriodicalId":100890,"journal":{"name":"Materials Science and Engineering","volume":"99 1","pages":"Pages 281-283"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0025-5416(88)90340-0","citationCount":"1","resultStr":"{\"title\":\"Spectroscopic ellipsometry of amorphous Ni0.95Tb0.05 and crystalline nickel\",\"authors\":\"B.-Y. Yang, K. Vedam, P. Klosowski, J.S. Lannin\",\"doi\":\"10.1016/0025-5416(88)90340-0\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Spectroscopic ellipsometry was used to determine the pseudodielectric constants of thin film sputtered crystalline nickel and the concentrated amorphous Ni<sub>0.95</sub>Tb<sub>0.05</sub> alloy. The variation in <em>ϵ</em><sub>2</sub>(<em>ω</em>)/<em>λ</em>, which indicates the matrix element weighted joint density of states, is found to be relatively similar for both crystalline and amorphous systems. This is interpreted in terms of related short-range order and similar d band states in both these materials.</p></div>\",\"PeriodicalId\":100890,\"journal\":{\"name\":\"Materials Science and Engineering\",\"volume\":\"99 1\",\"pages\":\"Pages 281-283\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0025-5416(88)90340-0\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials Science and Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0025541688903400\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0025541688903400","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Spectroscopic ellipsometry of amorphous Ni0.95Tb0.05 and crystalline nickel
Spectroscopic ellipsometry was used to determine the pseudodielectric constants of thin film sputtered crystalline nickel and the concentrated amorphous Ni0.95Tb0.05 alloy. The variation in ϵ2(ω)/λ, which indicates the matrix element weighted joint density of states, is found to be relatively similar for both crystalline and amorphous systems. This is interpreted in terms of related short-range order and similar d band states in both these materials.
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