二氧化硅化学气相沉积动力学ⅰ:表面化学反应

Piotr B. Grabiec, Jan Przyłuski
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引用次数: 4

摘要

氧氧化硅烷沉积SiO2的工艺在集成电路制造中有着广泛的应用。然而,其机理和动力学尚不完全清楚。本文对化学气相沉积二氧化硅作了一般性的分析。在第一部分中,指出在低温SiO2沉积的情况下,需要考虑所有的过程阶段,即扩散,吸附和化学反应。分析了试剂的电子结构。这些研究的结果提出了表面反应的机理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The kinetics of silicon dioxide chemical vapour deposition I: Surface chemical reactions

The process of SiO2 deposition by oxidizing silane with oxygen is widely applied in manufacturing integrated circuits. However, its mechanism and kinetics are not fully understood. In this paper a general analysis of chemical vapour deposition of silicon dioxide is presented. In the first part, it is pointed out that in the case of low temperature SiO2 deposition it is necessary to consider all process stages, i.e. diffusion, adsorption and chemical reactions. The electron structures of reagents are analysed. As a result of these studies a mechanism for the surface reactions is proposed.

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