一种用于由大量电子设备组成的产品的可靠性演示试验的设备寿命模型

IF 1.3 Q4 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE
C. Kang
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引用次数: 0

摘要

本文章由计算机程序翻译,如有差异,请以英文原文为准。
A DEVICE-LIFE MODEL FOR RELIABILITY DEMONSTRATION TEST FOR A PRODUCT MADE UP OF A LARGE ARRAY OF ELECTRONIC DEVICES
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来源期刊
CiteScore
3.20
自引率
20.00%
发文量
0
审稿时长
4.3 months
期刊介绍: The primary aim of the International Journal of Innovative Computing, Information and Control (IJICIC) is to publish high-quality papers of new developments and trends, novel techniques and approaches, innovative methodologies and technologies on the theory and applications of intelligent systems, information and control. The IJICIC is a peer-reviewed English language journal and is published bimonthly
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