{"title":"CMOS集成电路串扰问题的概率方面","authors":"Cristinel Ababei, R. Marculescu, V. Sundarajan","doi":"10.1109/CICC.2000.852630","DOIUrl":null,"url":null,"abstract":"In this paper we present a probabilistic approach for analyzing the dependence of crosstalk effects on input pattern correlations. In particular, we show that the effects of coupling between interconnections, in current VLSI ICs, are strongly dependent on the spatio-temporal correlations at the primary inputs. Consequently, a smaller fraction of the total number of nets poses true crosstalk problems and only that fraction should be considered at lower levels of abstraction. The analysis is carried out at the logic-level of abstraction, which provides efficient CPU run time and memory usage.","PeriodicalId":20702,"journal":{"name":"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2000-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Probabilistic aspects of crosstalk problems in CMOS ICs\",\"authors\":\"Cristinel Ababei, R. Marculescu, V. Sundarajan\",\"doi\":\"10.1109/CICC.2000.852630\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we present a probabilistic approach for analyzing the dependence of crosstalk effects on input pattern correlations. In particular, we show that the effects of coupling between interconnections, in current VLSI ICs, are strongly dependent on the spatio-temporal correlations at the primary inputs. Consequently, a smaller fraction of the total number of nets poses true crosstalk problems and only that fraction should be considered at lower levels of abstraction. The analysis is carried out at the logic-level of abstraction, which provides efficient CPU run time and memory usage.\",\"PeriodicalId\":20702,\"journal\":{\"name\":\"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2000.852630\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2000.852630","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Probabilistic aspects of crosstalk problems in CMOS ICs
In this paper we present a probabilistic approach for analyzing the dependence of crosstalk effects on input pattern correlations. In particular, we show that the effects of coupling between interconnections, in current VLSI ICs, are strongly dependent on the spatio-temporal correlations at the primary inputs. Consequently, a smaller fraction of the total number of nets poses true crosstalk problems and only that fraction should be considered at lower levels of abstraction. The analysis is carried out at the logic-level of abstraction, which provides efficient CPU run time and memory usage.