聚合物薄膜的非接触介电测量

B. Škipina, A. S. Luyt, D. Dudić
{"title":"聚合物薄膜的非接触介电测量","authors":"B. Škipina, A. S. Luyt, D. Dudić","doi":"10.7251/comen1901001s","DOIUrl":null,"url":null,"abstract":"Dielectric characterization of materials in the RF domain is usually carried out on samples with applied electroconductive electrodes. A high-quality contact between a sample and the measuring electrodes provides a stable current flow through the sample and information on the exact value of the electric field in which the sample is located. It also enables a simple measuring instrument to determine the dielectric parameters of the material being tested. However, the presence of contact potentials and the exchange of charge between the test material and the applied electrodes can mask some electrical phenomena in the material or significantly affect how we perceive these phenomena. In order to detect weak electrical processes in the material, for example the photoelectric response of non-polar polymers, contactless dielectric measurements must be carried out. The literature on non-contact dielectric measurements in the RF domain is poor, and because of that, this paper presents the methodology for determining the dielectric parameters of film-shaped materials in conditions of contactless dielectric measurements.","PeriodicalId":10617,"journal":{"name":"Contemporary Materials","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"NON-CONTACT DIELECTRIC MEASUREMENTS ON POLYMER FILMS\",\"authors\":\"B. Škipina, A. S. Luyt, D. Dudić\",\"doi\":\"10.7251/comen1901001s\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dielectric characterization of materials in the RF domain is usually carried out on samples with applied electroconductive electrodes. A high-quality contact between a sample and the measuring electrodes provides a stable current flow through the sample and information on the exact value of the electric field in which the sample is located. It also enables a simple measuring instrument to determine the dielectric parameters of the material being tested. However, the presence of contact potentials and the exchange of charge between the test material and the applied electrodes can mask some electrical phenomena in the material or significantly affect how we perceive these phenomena. In order to detect weak electrical processes in the material, for example the photoelectric response of non-polar polymers, contactless dielectric measurements must be carried out. The literature on non-contact dielectric measurements in the RF domain is poor, and because of that, this paper presents the methodology for determining the dielectric parameters of film-shaped materials in conditions of contactless dielectric measurements.\",\"PeriodicalId\":10617,\"journal\":{\"name\":\"Contemporary Materials\",\"volume\":\"1 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-01-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Contemporary Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.7251/comen1901001s\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Contemporary Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7251/comen1901001s","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

材料在射频域中的介电特性通常是在施加导电电极的样品上进行的。样品和测量电极之间的高质量接触提供了通过样品的稳定电流和样品所在电场的确切值的信息。它还使一个简单的测量仪器能够确定被测材料的介电参数。然而,接触电位的存在和测试材料与应用电极之间的电荷交换可以掩盖材料中的一些电现象或显著影响我们如何感知这些现象。为了检测材料中的弱电过程,例如非极性聚合物的光电响应,必须进行非接触介电测量。关于射频域非接触介电测量的文献很少,因此,本文提出了在非接触介电测量条件下确定膜状材料介电参数的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
NON-CONTACT DIELECTRIC MEASUREMENTS ON POLYMER FILMS
Dielectric characterization of materials in the RF domain is usually carried out on samples with applied electroconductive electrodes. A high-quality contact between a sample and the measuring electrodes provides a stable current flow through the sample and information on the exact value of the electric field in which the sample is located. It also enables a simple measuring instrument to determine the dielectric parameters of the material being tested. However, the presence of contact potentials and the exchange of charge between the test material and the applied electrodes can mask some electrical phenomena in the material or significantly affect how we perceive these phenomena. In order to detect weak electrical processes in the material, for example the photoelectric response of non-polar polymers, contactless dielectric measurements must be carried out. The literature on non-contact dielectric measurements in the RF domain is poor, and because of that, this paper presents the methodology for determining the dielectric parameters of film-shaped materials in conditions of contactless dielectric measurements.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信