某些晶体表面的MEED研究

G. Shimaoka
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引用次数: 0

摘要

设计了一种新型中能电子衍射(MEED)系统,该系统可以同时观测固体晶体同一表面的后向散射(BSMEED)和前向散射(RMEED)。从MgO(001)和GaAs(001)得到的结果表明,MEED具有以下有利特征:(1)与LEED不同,MEED不需要带网格的衍射光束的后加速。衍射图样可以直接在荧光屏上看到。(2)入射光束的准直和聚焦很容易实现,并观察到尖锐的衍射斑点。(3)与RHEED不同,MEED不需要严格平坦的表面。相对粗糙但干净的表面可以产生衍射图案。(4)从菊池线或带可以确定晶体表面的精确方向。(5)通过改变入射光束的能量,可以在二维和三维上观察到表层。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
MEED study of some crystalline surfaces

A new medium energy electron diffraction (MEED) system, which can observe both back scattering (BSMEED) and forward scattering (RMEED) patterns from the same surface of crystalline solids has been designed. Results obtained from MgO(001) and GaAs(001) indicate that MEED has the following favourable characteristics: (1) Unlike LEED, post-acceleration of the diffracted beam with a grid is not necessary for MEED. The diffraction pattern can be seen directly on a fluorescent screen. (2) Collimation and focusing of the incident beam are readily achieved and sharp diffraction spots are observed. (3) Unlike RHEED, a strictly flat surface is not necessary for MEED. Relatively rough, but clean surfaces can produce diffraction patterns. (4) From Kikuchi lines or bands it is possible to determine the precise orientation of the crystal surface. (5) By changing the energy of the incident beam it is possible to observe the surface layer both in two and three dimensions.

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