InGaAs/GaAs应变层单量子阱的低温生长

K. Yasutake, A. Takeuchi, H. Kakiuchi, Y. Okuyama, K. Yoshii, H. Kawabe
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引用次数: 0

摘要

通过迁移增强外延(MEE),在200 ~ 540℃的温度下生长出InGaAs/GaAs应变层单量子阱(SSQW)结构。通过测量的光致发光(PL)发射峰波长与理论计算的理想量子阱发射峰波长的比较,对制备的结构进行了表征。在高温下(400 ~ 540℃)制作的SSQWs中,观测到比计算出的波长更短的PL峰位移。PL峰的蓝移归因于In原子的表面偏析和解吸。将MEE的生长温度降低到300℃以下,可以抑制In偏析,并从SSQW获得设计的PL波长。结果表明,制备无过量配位的GaAs (2 × 4) -As表面和III族原子的长迁移时间是获得高PL强度的必要条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low temperature growth of InGaAs/GaAs strained-layer single quantum wells
InGaAs/GaAs strained-layer single quantum well (SSQW) structures have been grown at temperatures from 200 to 540°C by migration enhanced epitaxy (MEE). Fabricated structures were characterized by comparing the measured wavelength of photoluminescence (PL) emission peak with the theoretically calculated one for ideal quantum wells. In the SSQWs made at high temperatures (400 - 540°C), large PL peak shifts to the shorter wavelengths than the calculated ones were observed. This blue shift of the PL peak was attributed to the surface segregation and desorption of In atoms. Lowering the growth temperature of MEE below 300°C, the In segregation was suppressed and the designed PL wavelength from the SSQW was obtained. It was shown that the preparation of GaAs (2 × 4) -As surface without excess Assticking and the long migration time of group III atoms were needed to obtain the high PL intensity from SSQW.
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