{"title":"碳纳米管场效应晶体管中的光致静电掺杂效应","authors":"Dexing Liu, Weihong Huang, Qinqi Ren, M. Zhang","doi":"10.1109/NANO51122.2021.9514302","DOIUrl":null,"url":null,"abstract":"A photoinduced electrostatic doping effect based on bottom-gate carbon nanotube field-effect transistors (CNT-FETs) with poly (urea-urethane) as dielectric is reported for the first time. The transistors exhibit significant changes in their transfer characteristics as a result of low-intensity visible light illumination (~6.2 m W cm−2), mainly including the increase in the order of magnitude of the on-current and a shift in threshold voltage. The photoinduced phenomenon can be explained by a photoinduced electron trapping model, in which the photogenerated electrons in the Si-gate are trapped by the polymer dielectric layer at a negative gate voltage and induces more hole carriers in the semiconducting carbon nanotubes (S-CNTs) channel.","PeriodicalId":6791,"journal":{"name":"2021 IEEE 21st International Conference on Nanotechnology (NANO)","volume":"88 1","pages":"478-481"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Photoinduced Electrostatic Doping Effect in Carbon Nanotube Field-Effect Transistors\",\"authors\":\"Dexing Liu, Weihong Huang, Qinqi Ren, M. Zhang\",\"doi\":\"10.1109/NANO51122.2021.9514302\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A photoinduced electrostatic doping effect based on bottom-gate carbon nanotube field-effect transistors (CNT-FETs) with poly (urea-urethane) as dielectric is reported for the first time. The transistors exhibit significant changes in their transfer characteristics as a result of low-intensity visible light illumination (~6.2 m W cm−2), mainly including the increase in the order of magnitude of the on-current and a shift in threshold voltage. The photoinduced phenomenon can be explained by a photoinduced electron trapping model, in which the photogenerated electrons in the Si-gate are trapped by the polymer dielectric layer at a negative gate voltage and induces more hole carriers in the semiconducting carbon nanotubes (S-CNTs) channel.\",\"PeriodicalId\":6791,\"journal\":{\"name\":\"2021 IEEE 21st International Conference on Nanotechnology (NANO)\",\"volume\":\"88 1\",\"pages\":\"478-481\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 21st International Conference on Nanotechnology (NANO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NANO51122.2021.9514302\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 21st International Conference on Nanotechnology (NANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO51122.2021.9514302","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
首次报道了以聚脲-氨基甲酸乙酯为介质的底栅碳纳米管场效应晶体管(cnt - fet)的光致静电掺杂效应。在低强度可见光照射下(~6.2 m W cm−2),晶体管的传输特性发生了显著变化,主要包括导通电流的数量级增加和阈值电压的移位。光致现象可以通过光致电子捕获模型来解释,其中硅栅极中的光生电子在负栅极电压下被聚合物介电层捕获,并在半导体碳纳米管(S-CNTs)通道中诱导出更多空穴载流子。
A Photoinduced Electrostatic Doping Effect in Carbon Nanotube Field-Effect Transistors
A photoinduced electrostatic doping effect based on bottom-gate carbon nanotube field-effect transistors (CNT-FETs) with poly (urea-urethane) as dielectric is reported for the first time. The transistors exhibit significant changes in their transfer characteristics as a result of low-intensity visible light illumination (~6.2 m W cm−2), mainly including the increase in the order of magnitude of the on-current and a shift in threshold voltage. The photoinduced phenomenon can be explained by a photoinduced electron trapping model, in which the photogenerated electrons in the Si-gate are trapped by the polymer dielectric layer at a negative gate voltage and induces more hole carriers in the semiconducting carbon nanotubes (S-CNTs) channel.