汽车继电器中氧化银锡触点腐蚀

C. Leung, A. Lee
{"title":"汽车继电器中氧化银锡触点腐蚀","authors":"C. Leung, A. Lee","doi":"10.1109/HOLM.1993.489661","DOIUrl":null,"url":null,"abstract":"The erosion properties of a silver tin oxide contact material used in automotive DC relays were evaluated as a function of current and life cycles in lampload switching. The eroded surfaces were analyzed and an erosion mechanism based on transfer interface fracture was presented to explain the contact resistance, material transfer and welding properties of the silver tin oxide contact material. Pip and crater formation in silver tin oxide are small because of a weak deposit/cathode interface that resulted in delamination of pips.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"399 1","pages":"61-67"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Silver tin oxide contact erosion in automotive relays\",\"authors\":\"C. Leung, A. Lee\",\"doi\":\"10.1109/HOLM.1993.489661\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The erosion properties of a silver tin oxide contact material used in automotive DC relays were evaluated as a function of current and life cycles in lampload switching. The eroded surfaces were analyzed and an erosion mechanism based on transfer interface fracture was presented to explain the contact resistance, material transfer and welding properties of the silver tin oxide contact material. Pip and crater formation in silver tin oxide are small because of a weak deposit/cathode interface that resulted in delamination of pips.\",\"PeriodicalId\":11624,\"journal\":{\"name\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"volume\":\"399 1\",\"pages\":\"61-67\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-09-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.1993.489661\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1993.489661","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

摘要

研究了一种用于汽车直流继电器的氧化银锡触点材料的腐蚀性能,并将其作为灯载开关中电流和寿命周期的函数进行了评估。对侵蚀表面进行了分析,提出了基于传递界面断裂的侵蚀机理,以解释氧化银锡接触材料的接触电阻、材料转移和焊接性能。在氧化银锡中,由于较弱的沉积/阴极界面导致了颗粒的分层,颗粒和坑的形成很小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Silver tin oxide contact erosion in automotive relays
The erosion properties of a silver tin oxide contact material used in automotive DC relays were evaluated as a function of current and life cycles in lampload switching. The eroded surfaces were analyzed and an erosion mechanism based on transfer interface fracture was presented to explain the contact resistance, material transfer and welding properties of the silver tin oxide contact material. Pip and crater formation in silver tin oxide are small because of a weak deposit/cathode interface that resulted in delamination of pips.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信