金属膜精密电阻器:电阻金属膜和新的电阻器概念

J.J. Van Den Broek , J.J.T.M. Donkers , R.A.F. Van Der Rijt , J.T.M. Janssen
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引用次数: 37

摘要

精密电阻器的金属薄膜结合了非常低的电阻温度依赖性和只有0.1%的电阻公差。耐腐蚀性和对基材的附着力是最重要的。使用了不同种类的材料。对于低欧姆应用,我们使用成分约为65 at的Cu-Ni合金。%(原子百分比)的铜。对于这种特殊合金,电阻低温系数(TCR)是一种稳定的固有特性。然而,对于大多数合金来说,退火是接近零TCR状态的必要条件。这是NiCrAl合金的情况,用于中等范围的电阻和用于高欧姆应用的SiCrN。在高欧姆薄膜中,金属通常与氧化物或氮化物等非金属物质结合。合金成分、溅射条件和退火工艺的变化是获得最佳薄膜性能的重要因素。薄膜表征的重要工具是电子显微镜和相关技术以及耐高温测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Metal film precision resistors: Resistive metal films and a new resistor concept

Metal-films for precision resistors combine a very low temperature dependence of the electrical resistance with a tolerance of the resistance of only 0.1%. Corrosion resistance and adhesion to the substrate are of major importance. There are different classes of materials being utilised. For low ohmic applications, we use Cu-Ni alloys with a composition of about 65 at. % (atomic percent) of Cu. For this special alloy, the low temperature coefficient of the resistance (TCR) is a stable, intrinsic property. For most alloys, however, annealing is essential to approach the state of zero TCR. This is the case for the NiCrAl alloys, used for the mid-range of resistances and for SiCrN for high ohmic applications. In high ohmic films, metals are often combined with non-metallic substances like oxides or nitrides. Variation of alloy composition, sputtering conditions and annealing procedures are important for obtaining optimum thin-film properties. Important tools for thin-film characterisation are electron microscopy and related techniques together with high-temperature resistance measurement.

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