{"title":"一个30.1μm2, <±1.1°c -3σ-误差,0.4 ~ 1.0 v的基于直接阈值电压传感的温度传感器,用于片上密集热监测","authors":"Seongjong Kim, Mingoo Seok","doi":"10.1109/CICC.2015.7338397","DOIUrl":null,"url":null,"abstract":"This paper presents on-chip temperature sensor circuits for dense thermal monitoring in digital VLSI systems. The sensor directly captures the temperature dependency of threshold voltage. The prototype in a 65nm demonstrates that as compared to the state of the arts it can achieve a 9× smaller footprint of 30.1μm2 and a 3× smaller 3σ-error of <;±1.1°C after one temperature point calibration. The proposed sensor also achieves a 0.2V better voltage scalability than the previous best voltage-scalable design.","PeriodicalId":6665,"journal":{"name":"2015 IEEE Custom Integrated Circuits Conference (CICC)","volume":"1 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A 30.1μm2, < ±1.1°C-3σ-error, 0.4-to-1.0V temperature sensor based on direct threshold-voltage sensing for on-chip dense thermal monitoring\",\"authors\":\"Seongjong Kim, Mingoo Seok\",\"doi\":\"10.1109/CICC.2015.7338397\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents on-chip temperature sensor circuits for dense thermal monitoring in digital VLSI systems. The sensor directly captures the temperature dependency of threshold voltage. The prototype in a 65nm demonstrates that as compared to the state of the arts it can achieve a 9× smaller footprint of 30.1μm2 and a 3× smaller 3σ-error of <;±1.1°C after one temperature point calibration. The proposed sensor also achieves a 0.2V better voltage scalability than the previous best voltage-scalable design.\",\"PeriodicalId\":6665,\"journal\":{\"name\":\"2015 IEEE Custom Integrated Circuits Conference (CICC)\",\"volume\":\"1 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Custom Integrated Circuits Conference (CICC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2015.7338397\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Custom Integrated Circuits Conference (CICC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2015.7338397","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 30.1μm2, < ±1.1°C-3σ-error, 0.4-to-1.0V temperature sensor based on direct threshold-voltage sensing for on-chip dense thermal monitoring
This paper presents on-chip temperature sensor circuits for dense thermal monitoring in digital VLSI systems. The sensor directly captures the temperature dependency of threshold voltage. The prototype in a 65nm demonstrates that as compared to the state of the arts it can achieve a 9× smaller footprint of 30.1μm2 and a 3× smaller 3σ-error of <;±1.1°C after one temperature point calibration. The proposed sensor also achieves a 0.2V better voltage scalability than the previous best voltage-scalable design.