玻璃回流工艺用于电气隔离和临时支持二维微扫描仪

Minyoung Yun, Daehun Jeong, Seunghwan Moon, Jong-Hyun Lee
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引用次数: 0

摘要

在二维静电微扫描仪中,用于分离二维致动器电流路径的电气隔离和用于提高扫描仪制造可靠性的临时支撑仍然是主要问题。本文提出了一种既能实现电气隔离又能实现临时支撑的玻璃回流工艺。玻璃成功回流到不同宽度(15 μm, 25 μm和35 μm)和长度(25 μm, 50 μm和100 μm)的硅沟槽中,并将从击穿电压和制造成品率方面进行评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Glass reflow process for an electrical isolation and temporary support of two-dimensional microscanner
In a two-dimensional (2-D) electrostatic microscanner, electrical isolation for separating the current paths of the 2-D actuator and temporary support for enhancing the reliability of the scanner fabrication are still major issues. In this paper, a glass reflow process was proposed to achieve both electrical isolation and temporary support. The glass was successfully reflowed into the silicon trenches with various widths (15 μm, 25 μm and 35 μm) and lengths (25 μm, 50 μm and 100 μm), which will be also evaluated in terms of breakdown voltage and fabrication yield.
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