化合物半导体AlAsSb/In0.59Ga0.41As/GaAs0.53Sb0.47的工艺序列优化及纳米异质结构分析

J. Vijay, Divya Bharadwaj, Amit Rathi
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引用次数: 0

摘要

本文讨论了复合材料AlAsSb/In0.59Ga0.41As/GaAs0.53Sb0.47双量子阱结构的工艺顺序优化。通过对材料性质、纳米尺度工程和MBE生长参数的文献研究,选择了序列的优化参数。异质结构中材料层的厚度在我们的控制之下。这是异质结构用于器件构造的一个显著优点。为了使三元材料AlAsSb、InGaAs和GaAsSb的外延生长均匀,在MBE中沉积时间选择很慢,即每小时0.5微米。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Process sequence optimization and structural analysis of nanoscale heterostructure using compound semiconductors AlAsSb/In0.59Ga0.41As/GaAs0.53Sb0.47
In this work, the process sequence optimization for double quantum well structure with compound materials AlAsSb/In0.59Ga0.41As/GaAs0.53Sb0.47 is discussed for fabrication purposes. The optimized parameters of the sequences are selected based on the literature study of the materials properties, nanoscale engineering and MBE growth parameters. The thickness of the material layers in the heterostructure is under our control. This is a significant benefit of heterostructures for device construction. In order for uniform epitaxial growth of ternary material AlAsSb, InGaAs and GaAsSb, the deposition time is chosen very slow i.e. 0.5 micrometers per hour during the process in the MBE.
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