P. Bele, U. Stimming, H. Yano, H. Uchida, Masahiro Watanabe
{"title":"使用LAT图像处理的STEM图像分析","authors":"P. Bele, U. Stimming, H. Yano, H. Uchida, Masahiro Watanabe","doi":"10.1002/IMIC.200990059","DOIUrl":null,"url":null,"abstract":"In order to develop catalysts it is important to characterize the system in terms of particle size and size distribution. TEM or STEM are used as the state-of-the-art methods. In this study monodispersed Pt3Co alloy nanoparticles supported on carbon black (CB) prepared by the nanocapsule method are investigated and the results are compared with a commercially available Pt3Co/C catalyst system. To avoid the obstacles of conventional bright-field TEM or STEM regarding the image analysis, an advanced computerized image processing procedure is introduced. The so-called local adaptive threshold (LAT) is a method for a precise determination of particle diameter and size distribution in the subnanometer scale. The results demonstrate the advantage of a completely computerized particle evaluation as compared to a conventional particle analysis.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"2 1","pages":"34-38"},"PeriodicalIF":0.0000,"publicationDate":"2009-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"STEM Image Analysis Using LAT Image Processing\",\"authors\":\"P. Bele, U. Stimming, H. Yano, H. Uchida, Masahiro Watanabe\",\"doi\":\"10.1002/IMIC.200990059\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to develop catalysts it is important to characterize the system in terms of particle size and size distribution. TEM or STEM are used as the state-of-the-art methods. In this study monodispersed Pt3Co alloy nanoparticles supported on carbon black (CB) prepared by the nanocapsule method are investigated and the results are compared with a commercially available Pt3Co/C catalyst system. To avoid the obstacles of conventional bright-field TEM or STEM regarding the image analysis, an advanced computerized image processing procedure is introduced. The so-called local adaptive threshold (LAT) is a method for a precise determination of particle diameter and size distribution in the subnanometer scale. The results demonstrate the advantage of a completely computerized particle evaluation as compared to a conventional particle analysis.\",\"PeriodicalId\":100658,\"journal\":{\"name\":\"Imaging & Microscopy\",\"volume\":\"2 1\",\"pages\":\"34-38\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Imaging & Microscopy\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/IMIC.200990059\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging & Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/IMIC.200990059","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In order to develop catalysts it is important to characterize the system in terms of particle size and size distribution. TEM or STEM are used as the state-of-the-art methods. In this study monodispersed Pt3Co alloy nanoparticles supported on carbon black (CB) prepared by the nanocapsule method are investigated and the results are compared with a commercially available Pt3Co/C catalyst system. To avoid the obstacles of conventional bright-field TEM or STEM regarding the image analysis, an advanced computerized image processing procedure is introduced. The so-called local adaptive threshold (LAT) is a method for a precise determination of particle diameter and size distribution in the subnanometer scale. The results demonstrate the advantage of a completely computerized particle evaluation as compared to a conventional particle analysis.