用单自旋磁力计表征CrTe2薄片的室温平面内磁化

F. Fabre, A. Finco, A. Purbawati, A. Hadj-Azzem, N. Rougemaille, J. Coraux, I. Philip, V. Jacques
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引用次数: 15

摘要

我们证明了CrTe$_2$范德华铁磁体薄片具有面内磁各向异性的室温铁磁性。利用基于金刚石中氮空位缺陷的单自旋磁强计的定量磁成像,我们推断出厚度低至20 nm的薄片的室温平面内磁化范围为$M\sim 25$ kA/ M。这些结果使得CrTe$_2$在不断增长的范德华铁磁体家族中成为一个独特的体系,因为它是迄今为止已知的唯一的材料平台,在薄片中提供了固有的平面内磁化和居里温度高于$300$ K。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characterization of room-temperature in-plane magnetization in thin flakes of CrTe2 with a single-spin magnetometer
We demonstrate room-temperature ferromagnetism with in-plane magnetic anisotropy in thin flakes of the CrTe$_2$ van der Waals ferromagnet. Using quantitative magnetic imaging with a single spin magnetometer based on a nitrogen-vacancy defect in diamond, we infer a room-temperature in-plane magnetization in the range of $M\sim 25$ kA/m for flakes with thicknesses down to $20$ nm. These results make CrTe$_2$ a unique system in the growing family of van der Waals ferromagnets, because it is the only material platform known to date which offers an intrinsic in-plane magnetization and a Curie temperature above $300$ K in thin flakes.
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