As和P掺杂CdTe的亚带隙吸收

Michael Scarpull, N. Rock, Akira Nagaoka
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引用次数: 0

摘要

在富镉成分中掺杂v族可以在保持CdTe太阳能电池寿命的同时最大化空穴浓度。之前我们证明了CdTe的空穴掺杂>1017cm−3,体寿命> 30ns。然而,样品暴露于光下的霍尔效应测量表明形成亚稳光诱导缺陷。在这里,我们报告早期尝试分离和表征这种缺陷的分光光度法。我们观察到,当空穴浓度为bbb10 - 17cm−3时,样品的光学带隙变窄,并且出现带尾现象。通过光电导率测量分离缺陷的能量阈值正在进行中。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sub-Band Gap Absoprtion in As and P Doped CdTe
Group-V doping in Cd-rich composition shows the promise of maximizing hole concentration while preserving lifetime in CdTe solar cells. Previously we demonstrated CdTe with hole doping >1017cm−3 and bulk lifetime >30 ns. However, Hall effect measurements of samples under exposure to light suggest the formation of metastable light induced defects. Here, we report early attempts to isolate and characterize this defect by means of spectrophotometry. We observe a narrowing of optical bandgap for samples with hole concentration >1017cm−3 as well as band tailing. Isolation of energy threshold of the defect via photoconductivity measurements are ongoing.
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