现场潜在诱发退化的早期检测:测试硅光伏组件的新方法

M. Florides, G. Makrides, G. Georghiou
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引用次数: 0

摘要

高压光伏(PV)系统受到电位诱导退化(PID)的影响。采用传统的数据分析方法进行PID检测,耗时较长,造成了未被察觉的能量损失。如果在早期检测到PID,可以采取适当的措施避免能量损失。本文提出了一种早期检测PID(< 1%功率损耗)的新方法。该方法基于低电流直流信号,因此可以在低成本传感器中实现。该方法在标准多电池晶体硅光伏组件上进行了实验测试,成功地检测出1%功率损耗前的PID。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Early Detection of Potential Induced Degradation in the Field: Testing a New Method for Silicon PV Modules
High voltage photovoltaic (PV) systems are affected by potential induced degradation (PID). PID detection by conventional data analysis methods could take a long time, leading to unnoticed energy loss. If PID is detected at an early stage, energy loss could be avoided by taking appropriate measures. This paper presents a new method for detecting PID at an early stage (< 1% power loss). The method is based on low-current DC signals and, hence, it could be implemented in a low-cost sensor. The method was tested experimentally on standard multi-cell crystalline silicon PV modules and successfully detected PID before 1% power loss.
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