{"title":"尤里卡模块的可靠性研究","authors":"J. Grez, J. Kolesar, F. Kampas","doi":"10.1016/0379-6787(91)90087-6","DOIUrl":null,"url":null,"abstract":"<div><p>Leakage current from glass/photovoltaic (PV) thin film/ethylene vinyl acetate/glass photovoltaic modules can be reduced to acceptable levels by removing the PV thin films at the border of the module. Sandblasting is a workable method to accomplish this. However, the resulting increase in the surface conductivity of the glass in the sandblasted region increases the width of the border required.</p></div>","PeriodicalId":101172,"journal":{"name":"Solar Cells","volume":"30 1","pages":"Pages 559-562"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0379-6787(91)90087-6","citationCount":"1","resultStr":"{\"title\":\"Reliability studies of Eureka modules\",\"authors\":\"J. Grez, J. Kolesar, F. Kampas\",\"doi\":\"10.1016/0379-6787(91)90087-6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Leakage current from glass/photovoltaic (PV) thin film/ethylene vinyl acetate/glass photovoltaic modules can be reduced to acceptable levels by removing the PV thin films at the border of the module. Sandblasting is a workable method to accomplish this. However, the resulting increase in the surface conductivity of the glass in the sandblasted region increases the width of the border required.</p></div>\",\"PeriodicalId\":101172,\"journal\":{\"name\":\"Solar Cells\",\"volume\":\"30 1\",\"pages\":\"Pages 559-562\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0379-6787(91)90087-6\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Solar Cells\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0379678791900876\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solar Cells","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0379678791900876","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Leakage current from glass/photovoltaic (PV) thin film/ethylene vinyl acetate/glass photovoltaic modules can be reduced to acceptable levels by removing the PV thin films at the border of the module. Sandblasting is a workable method to accomplish this. However, the resulting increase in the surface conductivity of the glass in the sandblasted region increases the width of the border required.