散斑干涉测量算法与系统的发展

Atika Atira Mohamad Shamsir, M. Z. Mat Jafri, L. H. San
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摘要

电子散斑干涉法(ESPI)是一种全领域的无损测量方法,广泛应用于汽车或飞机等金属体缺陷检测、数字电子元件集成电路缺陷检测以及贵重艺术品保护等行业。在该研究领域,该方法被广泛应用于开发多光谱激光源组合算法和开发新的实验室装置来实现多光谱散斑干涉测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of speckle interferometry algorithm and system
Electronic speckle pattern interferometry (ESPI) method is a wholefield, non destructive measurement method widely used in the industries such as detection of defects on metal bodies such as cars or aeroplanes, detection of defects in intergrated circuits in digital electronics components and in the preservation of priceless artwork. In this research field, this method is widely used to develop algorithms for combining multispectral laser sources and to develop a new laboratory setup for implementing the multispectral speckle interferometry.
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