Atika Atira Mohamad Shamsir, M. Z. Mat Jafri, L. H. San
{"title":"散斑干涉测量算法与系统的发展","authors":"Atika Atira Mohamad Shamsir, M. Z. Mat Jafri, L. H. San","doi":"10.1063/1.3586969","DOIUrl":null,"url":null,"abstract":"Electronic speckle pattern interferometry (ESPI) method is a wholefield, non destructive measurement method widely used in the industries such as detection of defects on metal bodies such as cars or aeroplanes, detection of defects in intergrated circuits in digital electronics components and in the preservation of priceless artwork. In this research field, this method is widely used to develop algorithms for combining multispectral laser sources and to develop a new laboratory setup for implementing the multispectral speckle interferometry.","PeriodicalId":6354,"journal":{"name":"2010 International Conference on Enabling Science and Nanotechnology (ESciNano)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of speckle interferometry algorithm and system\",\"authors\":\"Atika Atira Mohamad Shamsir, M. Z. Mat Jafri, L. H. San\",\"doi\":\"10.1063/1.3586969\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electronic speckle pattern interferometry (ESPI) method is a wholefield, non destructive measurement method widely used in the industries such as detection of defects on metal bodies such as cars or aeroplanes, detection of defects in intergrated circuits in digital electronics components and in the preservation of priceless artwork. In this research field, this method is widely used to develop algorithms for combining multispectral laser sources and to develop a new laboratory setup for implementing the multispectral speckle interferometry.\",\"PeriodicalId\":6354,\"journal\":{\"name\":\"2010 International Conference on Enabling Science and Nanotechnology (ESciNano)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Conference on Enabling Science and Nanotechnology (ESciNano)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1063/1.3586969\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Enabling Science and Nanotechnology (ESciNano)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.3586969","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Development of speckle interferometry algorithm and system
Electronic speckle pattern interferometry (ESPI) method is a wholefield, non destructive measurement method widely used in the industries such as detection of defects on metal bodies such as cars or aeroplanes, detection of defects in intergrated circuits in digital electronics components and in the preservation of priceless artwork. In this research field, this method is widely used to develop algorithms for combining multispectral laser sources and to develop a new laboratory setup for implementing the multispectral speckle interferometry.