一个独立的集成励磁/提取系统模拟BIST应用

M. Hafed, G. Roberts
{"title":"一个独立的集成励磁/提取系统模拟BIST应用","authors":"M. Hafed, G. Roberts","doi":"10.1109/CICC.2000.852623","DOIUrl":null,"url":null,"abstract":"An integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstruction filter and a comparator. It is capable of both generating arbitrary band-limited waveforms (for excitation purposes) and coherently digitizing arbitrary periodic analog waveforms (for DSP-based test and measurement). A prototype IC was fabricated in a 0.35 /spl mu/m CMOS process and was demonstrated to perform various curve tracing, oscilloscope, and spectrum analysis tasks.","PeriodicalId":20702,"journal":{"name":"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)","volume":"10 1","pages":"83-86"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"A stand-alone integrated excitation/extraction system for analog BIST applications\",\"authors\":\"M. Hafed, G. Roberts\",\"doi\":\"10.1109/CICC.2000.852623\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstruction filter and a comparator. It is capable of both generating arbitrary band-limited waveforms (for excitation purposes) and coherently digitizing arbitrary periodic analog waveforms (for DSP-based test and measurement). A prototype IC was fabricated in a 0.35 /spl mu/m CMOS process and was demonstrated to perform various curve tracing, oscilloscope, and spectrum analysis tasks.\",\"PeriodicalId\":20702,\"journal\":{\"name\":\"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)\",\"volume\":\"10 1\",\"pages\":\"83-86\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2000.852623\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2000.852623","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 27

摘要

介绍了一种用于混合信号电路的集成测试核心。除了一个简单的重构滤波器和一个比较器外,该核心由一个完全数字化的实现组成。它能够产生任意带限波形(用于激励目的)和相干数字化任意周期模拟波形(用于基于dsp的测试和测量)。在0.35 /spl mu/m的CMOS工艺中制作了原型IC,并演示了各种曲线跟踪,示波器和频谱分析任务。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A stand-alone integrated excitation/extraction system for analog BIST applications
An integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstruction filter and a comparator. It is capable of both generating arbitrary band-limited waveforms (for excitation purposes) and coherently digitizing arbitrary periodic analog waveforms (for DSP-based test and measurement). A prototype IC was fabricated in a 0.35 /spl mu/m CMOS process and was demonstrated to perform various curve tracing, oscilloscope, and spectrum analysis tasks.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信