一个独立的集成励磁/提取系统模拟BIST应用

Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044) Pub Date : 2000-05-21 DOI:10.1109/CICC.2000.852623

M. Hafed, G. Roberts

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引用次数: 27

摘要

介绍了一种用于混合信号电路的集成测试核心。除了一个简单的重构滤波器和一个比较器外，该核心由一个完全数字化的实现组成。它能够产生任意带限波形(用于激励目的)和相干数字化任意周期模拟波形(用于基于dsp的测试和测量)。在0.35 /spl mu/m的CMOS工艺中制作了原型IC，并演示了各种曲线跟踪，示波器和频谱分析任务。

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A stand-alone integrated excitation/extraction system for analog BIST applications

An integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstruction filter and a comparator. It is capable of both generating arbitrary band-limited waveforms (for excitation purposes) and coherently digitizing arbitrary periodic analog waveforms (for DSP-based test and measurement). A prototype IC was fabricated in a 0.35 /spl mu/m CMOS process and was demonstrated to perform various curve tracing, oscilloscope, and spectrum analysis tasks.

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来源期刊

Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)

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