{"title":"全电子太赫兹纳米显微镜","authors":"C. Liewald, F. Keilmann","doi":"10.1109/IRMMW-THZ.2018.8509941","DOIUrl":null,"url":null,"abstract":"We demonstrate 50-nm resolved near-field imaging at λ=500 μm for the first time, using a high-harmonic microwave circuit for emitting/detecting via free space to a standard s-SNOM, and map conductivity contrasts at near single-charge sensitivity.","PeriodicalId":6498,"journal":{"name":"2018 Conference on Lasers and Electro-Optics (CLEO)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"All-electronic THz Nanoscopy\",\"authors\":\"C. Liewald, F. Keilmann\",\"doi\":\"10.1109/IRMMW-THZ.2018.8509941\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate 50-nm resolved near-field imaging at λ=500 μm for the first time, using a high-harmonic microwave circuit for emitting/detecting via free space to a standard s-SNOM, and map conductivity contrasts at near single-charge sensitivity.\",\"PeriodicalId\":6498,\"journal\":{\"name\":\"2018 Conference on Lasers and Electro-Optics (CLEO)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 Conference on Lasers and Electro-Optics (CLEO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRMMW-THZ.2018.8509941\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Conference on Lasers and Electro-Optics (CLEO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2018.8509941","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We demonstrate 50-nm resolved near-field imaging at λ=500 μm for the first time, using a high-harmonic microwave circuit for emitting/detecting via free space to a standard s-SNOM, and map conductivity contrasts at near single-charge sensitivity.
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