{"title":"CdSe薄膜中的电吸收","authors":"T.O. Poehler, D. Abraham","doi":"10.1016/0031-9163(66)90388-X","DOIUrl":null,"url":null,"abstract":"<div><p>Measurements have been made on the optical absorption edge in vacuum evaporated CdSe films. The absorption edge, which is distorted due to the polycrystallive nature of the films, is observed to shift up to 0.02 eV under strong electric fields.</p></div>","PeriodicalId":101027,"journal":{"name":"Physics Letters","volume":"23 9","pages":"Pages 523-524"},"PeriodicalIF":0.0000,"publicationDate":"1966-11-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0031-9163(66)90388-X","citationCount":"1","resultStr":"{\"title\":\"Electroabsorption in CdSe films\",\"authors\":\"T.O. Poehler, D. Abraham\",\"doi\":\"10.1016/0031-9163(66)90388-X\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Measurements have been made on the optical absorption edge in vacuum evaporated CdSe films. The absorption edge, which is distorted due to the polycrystallive nature of the films, is observed to shift up to 0.02 eV under strong electric fields.</p></div>\",\"PeriodicalId\":101027,\"journal\":{\"name\":\"Physics Letters\",\"volume\":\"23 9\",\"pages\":\"Pages 523-524\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1966-11-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0031-9163(66)90388-X\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Physics Letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/003191636690388X\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physics Letters","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/003191636690388X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurements have been made on the optical absorption edge in vacuum evaporated CdSe films. The absorption edge, which is distorted due to the polycrystallive nature of the films, is observed to shift up to 0.02 eV under strong electric fields.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
