退火硫化镉薄膜的Xrd、光学和振动性能

S. Aksay
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引用次数: 3

摘要

采用超声喷雾热解法制备了硫化镉薄膜。这些薄膜在200-500℃的温度范围内在空气中退火5小时。采用x射线衍射(XRD)、拉曼光谱(Raman spectroscopy)、傅里叶变换红外光谱(FTIR)、紫外可见光谱(UV-vis)和原子力显微镜(AFM)研究了退火对硫化镉薄膜振动、结构、光学和形态性能的影响。x射线衍射数据表明,薄膜沿(100)方向沉降,呈六方纤锌矿型结构。结果表明,随着退火温度的升高,晶粒尺寸增大。计算了不同退火温度下CdS薄膜的光学带隙数在2.40 ~ 2.44 eV之间。拉曼结果显示,六边形CdS的1LO (300cm-1)和2LO (60cm -1)模式有两次上升。用红外光谱对其化学键进行了研究。在Cd-S声子模式和C-O声子模式下,薄膜在550 ~ 715和844 ~ 1160 cm-1的FTIR光谱中分别出现饱和上升。测定了所有薄膜的原子力显微镜。这些图像的颜色随退火温度的变化而变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
XRD, OPTICAL AND VIBRATIONAL PROPERTIES OF ANNEALED CADMIUM SULFIDE FILMS
Cadmium sulfide (CdS) films have been formed using an ultrasonic spray pyrolysis method. These films annealed at a temperature range of 200-500oC in air for 5 hours. The effects of annealing on the vibrational, structural, optical and morphological properties of cadmium sulfide films were looked at using X-ray diffraction (XRD), Raman spectroscopy, Fourier transform infrared (FTIR) spectroscopy, UV-visible spectroscopy(UV–vis) and atomic force microscopy (AFM). The X-ray diffraction data showed that the films had settled along (100) direction with a hexagonal wurtzite type structure. It was found that grain size goes up with an increase in the annealing temperature. The optical band gap numbers of the CdS film at different annealing temperatures were calculated and were found to be in the range of 2.40-2.44 eV. Raman results showed two rises attributed to the 1LO (300cm-1) and 2LO (601cm-1) modes of hexagonal CdS. The chemical bonding was studied by FTIR spectra. The saturation rises in the FTIR spectra of the films located at 550–715 and 844–1160 cm-1 can be given to the Cd–S and C–O phonon modes, respectively. The AFM of all the films were determined. These images colors changed with the annealing temperature.
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