{"title":"多层结构温度响应对选定参数的敏感性研究","authors":"Z. Suszyński, P. Majchrzak, L. Majchrzak","doi":"10.1051/JP4:2006137067","DOIUrl":null,"url":null,"abstract":"In this paper a method of analysis of sensibility of layered structure thermal impedance for changing of selected parameters values was presented. The parameters analysed were relative thickness of layer and quotient of effusivities of adjoined layers. The TLM method was used for the calculations.","PeriodicalId":14838,"journal":{"name":"Journal De Physique Iv","volume":"27 1","pages":"353-356"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Investigation of sensibility of temperature response on selected parameters of multilayer structure\",\"authors\":\"Z. Suszyński, P. Majchrzak, L. Majchrzak\",\"doi\":\"10.1051/JP4:2006137067\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper a method of analysis of sensibility of layered structure thermal impedance for changing of selected parameters values was presented. The parameters analysed were relative thickness of layer and quotient of effusivities of adjoined layers. The TLM method was used for the calculations.\",\"PeriodicalId\":14838,\"journal\":{\"name\":\"Journal De Physique Iv\",\"volume\":\"27 1\",\"pages\":\"353-356\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal De Physique Iv\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1051/JP4:2006137067\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal De Physique Iv","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1051/JP4:2006137067","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of sensibility of temperature response on selected parameters of multilayer structure
In this paper a method of analysis of sensibility of layered structure thermal impedance for changing of selected parameters values was presented. The parameters analysed were relative thickness of layer and quotient of effusivities of adjoined layers. The TLM method was used for the calculations.
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