{"title":"mgo - tio2基陶瓷材料的w波段表征","authors":"A. Cook, J. Calame, N. Mahadik","doi":"10.1109/IVEC.2014.6857538","DOIUrl":null,"url":null,"abstract":"We report characterization of low-loss MgO-TiO2 system ceramic materials in the 75-110 GHz (W-band) and 0.5-18 GHz frequency ranges. Measurements of the complex permittivity are used to study the dielectric constant, loss tangent, and DC conductivity (low-frequency) behavior of the materials for application in millimeter-wave vacuum electron devices. We investigate the effects of varying ceramic synthesis process parameters on the rf material properties.","PeriodicalId":88890,"journal":{"name":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","volume":"21 1","pages":"159-160"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterization of MgO-TiO2-based ceramic materials at W-band\",\"authors\":\"A. Cook, J. Calame, N. Mahadik\",\"doi\":\"10.1109/IVEC.2014.6857538\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report characterization of low-loss MgO-TiO2 system ceramic materials in the 75-110 GHz (W-band) and 0.5-18 GHz frequency ranges. Measurements of the complex permittivity are used to study the dielectric constant, loss tangent, and DC conductivity (low-frequency) behavior of the materials for application in millimeter-wave vacuum electron devices. We investigate the effects of varying ceramic synthesis process parameters on the rf material properties.\",\"PeriodicalId\":88890,\"journal\":{\"name\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"volume\":\"21 1\",\"pages\":\"159-160\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-04-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC.2014.6857538\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2014.6857538","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterization of MgO-TiO2-based ceramic materials at W-band
We report characterization of low-loss MgO-TiO2 system ceramic materials in the 75-110 GHz (W-band) and 0.5-18 GHz frequency ranges. Measurements of the complex permittivity are used to study the dielectric constant, loss tangent, and DC conductivity (low-frequency) behavior of the materials for application in millimeter-wave vacuum electron devices. We investigate the effects of varying ceramic synthesis process parameters on the rf material properties.