化学气相沉积氮化磷(P3N5)薄膜的热力学分析

S. Eroglu
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引用次数: 0

摘要

采用最小吉布斯自由能法对p3n5的化学气相沉积(CVD)进行了热力学分析,以评价ph3 - nh3 - n2、PCl 3 - nh3 - h2和PBr 3 - nh3 - h2气体混合物高产率合成单相p3n5薄膜的潜力。确定了p3n5的沉积条件为p3n5的输入反应物气体比p3n3 /(p3n3 + nh3) (X=H或Cl或Br)和常压下沉积温度的函数。当使用ph3 - nh3 - n2体系时,在几乎所有的反应物比和低于约700 K的温度下都能沉积单相p3n5。卤化物气体混合物的使用限制了形成单相p3n5的温度和输入反应物气体比的狭窄区域。通常丰度最高的气态物质有h2、n2、nh3、ph3、HCl、p4、pcl3、p2、HBr、pbr3和PN。热力学分析表明,在本文研究的体系中,ph3 - nh3 - n2混合物是最有前途的,因为它同时提供了最高的p3n5沉积收率,并且可以更好地控制CVD过程来合成p3n5薄膜。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thermodynamic Analysis of the Chemical Vapor Deposition of Phosphorus Nitride (P3N5) Thin Films
Thermodynamic analysis of the chemical vapor deposition (CVD) of P 3 N 5 has been performed using the method of the minimization of the Gibbs' free energy in order to evaluate the PH 3 -NH 3 -N 2 , PCl 3 -NH 3 -H 2 and PBr 3 -NH 3 -H 2 gaseous mixtures for their potential to synthesize single-phase P 3 N 5 films at high yields. The conditions for the deposition of P 3 N 5 have been determined as a function of input reactant gas ratio of PX 3 /(PX 3 +NH 3 ) (X=H or Cl or Br) and deposition temperature at atmospheric pressure. A single phase P 3 N 5 is deposited at almost all reactant ratios and at temperatures below about 700 K when the PH 3 -NH 3 -N 2 system is used. The use of halide gas mixtures limits the formation of single phase P 3 N 5 to narrow regions of temperature and input reactant gas ratio. The gaseous species generally present in greatest abundance are H 2 , N 2 , NH 3 , PH 3 , HCl, P 4 , PCl 3 , P 2 , HBr, PBr 3 and PN. The thermodynamic analysis suggests that among the systems investigated here, the PH 3 -NH 3 -N 2 mixture is the most promising because simultaneously it gives the highest P 3 N 5 deposition yield and allows better control of the CVD process for the synthesis of P 3 N 5 films.
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