Shinji Inoue, Tatsunori Hashimoto, Toshihiko Nagano, Jiro Yoshida
{"title":"YBaCuO/共掺杂PrBaCuO/YBaCuO斜坡边结及其在触发器电路中的应用","authors":"Shinji Inoue, Tatsunori Hashimoto, Toshihiko Nagano, Jiro Yoshida","doi":"10.1016/S0964-1807(99)00052-6","DOIUrl":null,"url":null,"abstract":"<div><p>We fabricated YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−<em>x</em></sub>/PrBa<sub>2</sub>Cu<sub>2.8</sub>Co<sub>0.2</sub>O<sub>7−<em>y</em></sub>/YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−<em>x</em></sub><span> ramp-edge Josephson junctions and measured their current–voltage (</span><em>I</em>–<em>V</em>) characteristics. Critical current (<em>I</em><sub>c</sub>) and conductance (<em>G</em>) were evaluated as a function of the barrier layer thickness, and both of them exhibited a nearly exponential dependence. The decay parameters for <em>I</em><sub>c</sub> and <em>G</em> were estimated to be 1.1 and 1.5<!--> <!-->nm, respectively. We also examined superconducting quantum interference devices (SQUIDs) using this type of junction as a preliminary test for realizing oxide superconductive integrated circuits with high-speed operation. DC SQUIDs with direct-coupling control lines and no ground plane were fabricated and their loop inductance was evaluated. The obtained SQUID inductance ranged from 8 to 38<!--> <!-->pH for a 4-<em>μ</em>m-wide, 3- to 12-<em>μ</em><span>m-long hole in a rectangular SQUID loop. In addition, a flip–flop circuit based on such a dc SQUID was fabricated. Both flux trapping and flux detrapping in the SQUID loop hole were confirmed when 1-ms-wide current pulses were injected into the SQUID loop.</span></p></div>","PeriodicalId":100110,"journal":{"name":"Applied Superconductivity","volume":"6 10","pages":"Pages 843-847"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/S0964-1807(99)00052-6","citationCount":"0","resultStr":"{\"title\":\"YBaCuO/Co-doped PrBaCuO/YBaCuO ramp-edge junctions and their application to flip–flop circuits\",\"authors\":\"Shinji Inoue, Tatsunori Hashimoto, Toshihiko Nagano, Jiro Yoshida\",\"doi\":\"10.1016/S0964-1807(99)00052-6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>We fabricated YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−<em>x</em></sub>/PrBa<sub>2</sub>Cu<sub>2.8</sub>Co<sub>0.2</sub>O<sub>7−<em>y</em></sub>/YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−<em>x</em></sub><span> ramp-edge Josephson junctions and measured their current–voltage (</span><em>I</em>–<em>V</em>) characteristics. Critical current (<em>I</em><sub>c</sub>) and conductance (<em>G</em>) were evaluated as a function of the barrier layer thickness, and both of them exhibited a nearly exponential dependence. The decay parameters for <em>I</em><sub>c</sub> and <em>G</em> were estimated to be 1.1 and 1.5<!--> <!-->nm, respectively. We also examined superconducting quantum interference devices (SQUIDs) using this type of junction as a preliminary test for realizing oxide superconductive integrated circuits with high-speed operation. DC SQUIDs with direct-coupling control lines and no ground plane were fabricated and their loop inductance was evaluated. The obtained SQUID inductance ranged from 8 to 38<!--> <!-->pH for a 4-<em>μ</em>m-wide, 3- to 12-<em>μ</em><span>m-long hole in a rectangular SQUID loop. In addition, a flip–flop circuit based on such a dc SQUID was fabricated. Both flux trapping and flux detrapping in the SQUID loop hole were confirmed when 1-ms-wide current pulses were injected into the SQUID loop.</span></p></div>\",\"PeriodicalId\":100110,\"journal\":{\"name\":\"Applied Superconductivity\",\"volume\":\"6 10\",\"pages\":\"Pages 843-847\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/S0964-1807(99)00052-6\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Superconductivity\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0964180799000526\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Superconductivity","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0964180799000526","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
YBaCuO/Co-doped PrBaCuO/YBaCuO ramp-edge junctions and their application to flip–flop circuits
We fabricated YBa2Cu3O7−x/PrBa2Cu2.8Co0.2O7−y/YBa2Cu3O7−x ramp-edge Josephson junctions and measured their current–voltage (I–V) characteristics. Critical current (Ic) and conductance (G) were evaluated as a function of the barrier layer thickness, and both of them exhibited a nearly exponential dependence. The decay parameters for Ic and G were estimated to be 1.1 and 1.5 nm, respectively. We also examined superconducting quantum interference devices (SQUIDs) using this type of junction as a preliminary test for realizing oxide superconductive integrated circuits with high-speed operation. DC SQUIDs with direct-coupling control lines and no ground plane were fabricated and their loop inductance was evaluated. The obtained SQUID inductance ranged from 8 to 38 pH for a 4-μm-wide, 3- to 12-μm-long hole in a rectangular SQUID loop. In addition, a flip–flop circuit based on such a dc SQUID was fabricated. Both flux trapping and flux detrapping in the SQUID loop hole were confirmed when 1-ms-wide current pulses were injected into the SQUID loop.
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