P. de Zea Bermudez , J. Miguel Marín , Håvard Rue , Helena Veiga
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引用次数: 0
摘要
我们的目标是实现集成嵌套拉普拉斯近似法(INLA),众所周知,该方法非常快速高效,可用于估计阈值随机波动率(TSV)模型的参数。INLA 用精确的确定性近似代替了马尔可夫链蒙特卡罗(MCMC)模拟。使用了弱信息适当先验和惩罚复杂性 (PC) 先验。仿真结果倾向于使用 PC 前验,特别是当样本量从小到大不等时。对于这些样本量,PC 前验能提供更准确的模型参数估计。然而,随着样本量的增加,两种类型的先验都能得出相似的参数估计。通过样本内和样本外方法,将该估计方法应用于包括股市、大宗商品和加密货币回报率在内的六个回报率序列,并对其性能进行了评估;同时还对一日前波动率进行了预测。实证结果表明,与对称随机波动率模型相比,TSV 通常是与收益率序列拟合度最高的模型,而且在预测一日前波动率方面,TSV 在大多数情况下都名列前茅。
Integrated nested Laplace approximations for threshold stochastic volatility models
The aim is to implement the integrated nested Laplace approximations (INLA), known to be very fast and efficient, for estimating the parameters of the threshold stochastic volatility (TSV) model. INLA replaces Markov chain Monte Carlo (MCMC) simulations with accurate deterministic approximations. Weakly informative proper priors are used, as well as Penalizing Complexity (PC) priors. The simulation results favor the use of PC priors, specially when the sample size varies from small to moderate. For these sample sizes, PC priors provide more accurate estimates of the model parameters. However, as sample size increases, both types of priors lead to similar estimates of the parameters. The estimation method is applied to six series of returns, including stock market, commodity and cryptocurrency returns, and its performance is assessed, by means of in-sample and out-of-sample approaches; the forecasting of one-day-ahead volatilities is also carried out. The empirical results support that the TSV is the model that generally fits the best to the series of returns and most of the times ranks the first in terms of forecasting one-day-ahead volatility, when compared to the symmetric stochastic volatility model.
期刊介绍:
Econometrics and Statistics is the official journal of the networks Computational and Financial Econometrics and Computational and Methodological Statistics. It publishes research papers in all aspects of econometrics and statistics and comprises of the two sections Part A: Econometrics and Part B: Statistics.