Picosecond nodal testing of centimeter-size superconducting Nb microstrip interconnects

We have implemented a low-temperature electro-optic sampling system for non-invasive, nodal testing of superconducting Nb integrated circuits. With submillivolt sensitivity and a subpicosecond temporal response, this system has been used to perform nodal analysis on rapid-single-flux quantum (RSFQ) devices and superconducting microstrip interconnects. Here we demonstrate that by measuring the propagation of 6-ps-wide pulses at various test nodes, we are able to fully characterize a superconducting microstrip waveguide the size of an entire chip. The transmission line was selected not only to perform the first complete characterization of a superconducting microstrip, but also to demonstrate full nodal testing of a foundry-fabricated RSFQ integrated circuit. Finally, our results provided much-needed feedback for improving computer simulations of superconducting digital circuits.