具有近似延迟补偿方案的8nm全数字7.3Gb/s/引脚LPDDR5 PHY

Kwanyeob Chae, JongRyun Choi, Hyungkwon Lee, J.I. Choi, Shinyoung Yi, Y. Nam, Sang-Won Hwang, Joohyun Lee, Won Lee, Kihwan Seong, Joo-Cheol Shin, Soo-Min Lee, Seokkyun Ko, Jihun Oh, B. Koo, Sanghune Park, Jongshin Shin, Hyungjong Ko
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引用次数: 3

摘要

提出了一种全数字7.3Gb/s/引脚LPDDR5 PHY。提出了一种不间断的近似延迟补偿方案,提高了系统对电压变化的容忍度,同时又不会造成存储中断。因此,无缝维护的dq中心提高了电源噪声下的访问有效窗口裕度,而不会影响性能。此外,由于电压变化容忍度高,该方案可以在最小的性能损失下实现直接DVFS切换。采用8nm工艺的LPDDR5 PHY在640mV和790mV下分别表现出6.4Gb/s/pin和0.31UI的性能,分别为7.3Gb/s/pin和0.25UI。电压变化公差测量到70mV无存储器访问断电。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An 8nm All-Digital 7.3Gb/s/pin LPDDR5 PHY with an Approximate Delay Compensation Scheme
An all-digital 7.3Gb/s/pin LPDDR5 PHY is presented. A non-interruptive approximate delay compensation scheme is proposed to enhance tolerance to voltage variation without any memory access black-out. Thus, seamlessly maintained DQ-centering improves access valid-window-margin under supply noise without performance penalty. In addition to that, the proposed scheme enables direct DVFS switching due to the voltage variation tolerance with minimized performance penalty. The LPDDR5 PHY in an 8nm technology demonstrated 6.4Gb/s/pin with 0.31UI at 640mV and 7.3Gb/s/pin with 0.25UI at 790mV, respectively. The voltage variation tolerance is measured up to 70mV without memory access black-out.
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