{"title":"集成APD和高背景光抗扰度的光无线接收电路","authors":"P. Brandl, R. Enne, H. Zimmermann","doi":"10.1109/ESSCIRC.2015.7313825","DOIUrl":null,"url":null,"abstract":"This paper presents two different monolithically integrated optoelectronic receiver circuits in one chip. One circuit includes a 200 μm diameter, high responsivity avalanche photodiode with a highly-sensitive receiver for wireless optical data communication at a data rate of 1Gbps with a sensitivity of -31.8 dBm. The second circuit includes two PN-photodiodes and a differential TIA with a nonlinear feedback to detect light power differences down to -90 dBm. The second circuit is implemented twice: for beam positioning in x- and y-direction. The chip was fabricated in a 0.35 μm high-voltage CMOS technology and tested under strong background-light conditions representative for optical wireless communication scenarios.","PeriodicalId":11845,"journal":{"name":"ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC)","volume":"28 1","pages":"48-51"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Optical wireless receiver circuit with integrated APD and high background-light immunity\",\"authors\":\"P. Brandl, R. Enne, H. Zimmermann\",\"doi\":\"10.1109/ESSCIRC.2015.7313825\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents two different monolithically integrated optoelectronic receiver circuits in one chip. One circuit includes a 200 μm diameter, high responsivity avalanche photodiode with a highly-sensitive receiver for wireless optical data communication at a data rate of 1Gbps with a sensitivity of -31.8 dBm. The second circuit includes two PN-photodiodes and a differential TIA with a nonlinear feedback to detect light power differences down to -90 dBm. The second circuit is implemented twice: for beam positioning in x- and y-direction. The chip was fabricated in a 0.35 μm high-voltage CMOS technology and tested under strong background-light conditions representative for optical wireless communication scenarios.\",\"PeriodicalId\":11845,\"journal\":{\"name\":\"ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC)\",\"volume\":\"28 1\",\"pages\":\"48-51\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.2015.7313825\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.2015.7313825","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optical wireless receiver circuit with integrated APD and high background-light immunity
This paper presents two different monolithically integrated optoelectronic receiver circuits in one chip. One circuit includes a 200 μm diameter, high responsivity avalanche photodiode with a highly-sensitive receiver for wireless optical data communication at a data rate of 1Gbps with a sensitivity of -31.8 dBm. The second circuit includes two PN-photodiodes and a differential TIA with a nonlinear feedback to detect light power differences down to -90 dBm. The second circuit is implemented twice: for beam positioning in x- and y-direction. The chip was fabricated in a 0.35 μm high-voltage CMOS technology and tested under strong background-light conditions representative for optical wireless communication scenarios.