会议TU3B:热载波效应和混频器技术

Ho Huang, Z. Bardai
{"title":"会议TU3B:热载波效应和混频器技术","authors":"Ho Huang, Z. Bardai","doi":"10.1109/MTT67880.2005.9387840","DOIUrl":null,"url":null,"abstract":"Hot carrier effects become an important consideration as device dimensions shrink to address higher frequency of operation. SiGe mixers have increasing importance due to potential for high level of integration and low cost. This session addresses the hot carrier effects in both GaAs and silicon circuits, 5 GHz mixer development, as well as tunable elements and isolation issues for insulating and silicon substrates.","PeriodicalId":13133,"journal":{"name":"IEEE MTT-S International Microwave Symposium Digest, 2005.","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Session TU3B: Hot Carrier Effects and Mixer Technology\",\"authors\":\"Ho Huang, Z. Bardai\",\"doi\":\"10.1109/MTT67880.2005.9387840\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Hot carrier effects become an important consideration as device dimensions shrink to address higher frequency of operation. SiGe mixers have increasing importance due to potential for high level of integration and low cost. This session addresses the hot carrier effects in both GaAs and silicon circuits, 5 GHz mixer development, as well as tunable elements and isolation issues for insulating and silicon substrates.\",\"PeriodicalId\":13133,\"journal\":{\"name\":\"IEEE MTT-S International Microwave Symposium Digest, 2005.\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-06-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE MTT-S International Microwave Symposium Digest, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTT67880.2005.9387840\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE MTT-S International Microwave Symposium Digest, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTT67880.2005.9387840","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

热载流子效应成为重要的考虑因素,因为器件尺寸缩小,以解决更高的工作频率。由于具有高集成度和低成本的潜力,SiGe混频器越来越重要。本次会议将讨论GaAs和硅电路中的热载子效应,5ghz混频器的开发,以及绝缘和硅衬底的可调谐元件和隔离问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Session TU3B: Hot Carrier Effects and Mixer Technology
Hot carrier effects become an important consideration as device dimensions shrink to address higher frequency of operation. SiGe mixers have increasing importance due to potential for high level of integration and low cost. This session addresses the hot carrier effects in both GaAs and silicon circuits, 5 GHz mixer development, as well as tunable elements and isolation issues for insulating and silicon substrates.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信