I. A. Marques de Oliveira, M. Pla, L. Escriche, J. Casabó, N. Zine, J. Bausells, F. Bessueille, J. Samitier, A. Errachid
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Nanocharacterization of a novel copper-membrane and functionalized insulator-semiconductor by atomic force microscopy
We describe the characterization of a novel copper-sensitive polymeric membrane and the electrochemical response of electrolyte-membrane-insulator-semiconductor structures. The membrane has shown a Nernstian response towards Cu(II) ions in electrodes.