基于局部性的电源垫块放置优化

Pingqiang Zhou, Vivek Mishra, S. Sapatnekar
{"title":"基于局部性的电源垫块放置优化","authors":"Pingqiang Zhou, Vivek Mishra, S. Sapatnekar","doi":"10.5555/2485288.2485681","DOIUrl":null,"url":null,"abstract":"This paper presents an efficient algorithm for the placement of power supply pads in flip-chip packaging for high-performance VLSI circuits. The placement problem is formulated as a mixed-integer linear program (MILP), subject to the constraints on mean-time-to-failure (MTTF) for the pads and the voltage drop in the power grid. To improve the performance of the optimizer, the pad placement problem is solved based on the divide-and-conquer principle, and the locality properties of the power grid are exploited by modeling the distant nodes and sources coarsely, following the coarsening stage in multi-grid-like approach. An accurate electromigration (EM) model that captures current crowding and Joule heating effects is developed and integrated with our C4 placement approach. The effectiveness of the proposed approach is demonstrated on several designs adapted from publicly released benchmarks.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"27 1","pages":"1655-1660"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Placement optimization of power supply pads based on locality\",\"authors\":\"Pingqiang Zhou, Vivek Mishra, S. Sapatnekar\",\"doi\":\"10.5555/2485288.2485681\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an efficient algorithm for the placement of power supply pads in flip-chip packaging for high-performance VLSI circuits. The placement problem is formulated as a mixed-integer linear program (MILP), subject to the constraints on mean-time-to-failure (MTTF) for the pads and the voltage drop in the power grid. To improve the performance of the optimizer, the pad placement problem is solved based on the divide-and-conquer principle, and the locality properties of the power grid are exploited by modeling the distant nodes and sources coarsely, following the coarsening stage in multi-grid-like approach. An accurate electromigration (EM) model that captures current crowding and Joule heating effects is developed and integrated with our C4 placement approach. The effectiveness of the proposed approach is demonstrated on several designs adapted from publicly released benchmarks.\",\"PeriodicalId\":6310,\"journal\":{\"name\":\"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"volume\":\"27 1\",\"pages\":\"1655-1660\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5555/2485288.2485681\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5555/2485288.2485681","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

本文提出了一种在高性能超大规模集成电路倒装封装中放置电源衬垫的有效算法。该布局问题是一个混合整数线性规划(MILP),受衬垫平均故障时间(MTTF)和电网电压降的约束。为了提高优化器的性能,采用分而治之的方法求解垫块放置问题,并在多网格类方法的粗化阶段,通过对远端节点和源进行粗化建模,利用电网的局部性特性。开发了一个精确的电迁移(EM)模型,可以捕获电流拥挤和焦耳热效应,并将其与我们的C4放置方法集成在一起。所提出的方法的有效性在几个设计上得到了证明,这些设计改编自公开发布的基准测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Placement optimization of power supply pads based on locality
This paper presents an efficient algorithm for the placement of power supply pads in flip-chip packaging for high-performance VLSI circuits. The placement problem is formulated as a mixed-integer linear program (MILP), subject to the constraints on mean-time-to-failure (MTTF) for the pads and the voltage drop in the power grid. To improve the performance of the optimizer, the pad placement problem is solved based on the divide-and-conquer principle, and the locality properties of the power grid are exploited by modeling the distant nodes and sources coarsely, following the coarsening stage in multi-grid-like approach. An accurate electromigration (EM) model that captures current crowding and Joule heating effects is developed and integrated with our C4 placement approach. The effectiveness of the proposed approach is demonstrated on several designs adapted from publicly released benchmarks.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信