用高聚焦高斯光束在散射计中表征光滑介电样品

2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) Pub Date : 2019-09-01 DOI:10.1109/IRMMW-THz.2019.8874078

M. Mrnka, P. Nielsen, Tonny Rubæk, C. Cappellin, R. Appleby, E. Sáenz

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引用次数: 2

摘要

本文描述了在50-750 GHz频率范围内的散射计积分测试中，ESA-ESTEC测量的光滑介质样品透射系数的数值验证。本文的目的是将标定测量的实验结果与GRASP中的数值模型进行比较，并描述一种提取材料参数的数值方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Characterization of Smooth Dielectric Samples with Highly Focused Gaussian Beams in a Scatterometer

This paper describes a numerical validation of the transmission coefficient of a smooth dielectric sample recently measured at ESA-ESTEC during the integration testing of a scatterometer operating in 50-750 GHz frequency range. The aim of the paper is to compare the experimental results of a calibrated measurement with a numerical model in GRASP and describe a numerical method for extracting material parameters.

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来源期刊

2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

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