掺杂POSS纳米填料增强环氧树脂表面闪络性能

Farooq Aslam, Guanghao Qu, Zhen Li, Haoming Xu, Weiwang Wang, Shengtao Li
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引用次数: 2

摘要

表面闪络是制约高压绝缘设备发展的关键问题。通过添加各种纳米填料来改善环氧复合材料的性能。以提高表面闪络性能为最终目标,将两种不同类型的多面体低聚硅氧烷(POSS)纳米分子结构掺杂到纯环氧树脂中。在SF6气体直流电压下测试了表面闪络电压。通过等温表面电位衰减(SPD)测试来了解表面电荷特性。通过量子化学计算,研究了环氧树脂/POSS复合材料的最低未占据分子轨道(LUMO)能级的绝对能量值与电子对载流子的亲和力有关。结果表明,电荷阱能量和阱密度对闪络电压均有正向影响。与EP/ECH-POSS和原始样品相比,EP/OG-POSS复合材料的闪络性能得到了改善,这主要归功于电荷的深层陷阱。能量分布图显示EP/OG-POSS对载流子的亲和力相对较高。对载流子的亲和力有助于电荷捕获中心。此外,POSS侧基的功能性质决定了深圈闭的裁剪;此外,模拟的电子特性有助于理解表面闪络电压的改进特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhancement of Surface flashover performance of epoxy by doping POSS nanofillers
Surface flashover is key issue to limit the development of high voltage insulation equipment. Various nano-fillers are added to improve the performance of epoxy composites. With the ultimate goal to enhance the surface flashover performance, two different types of polyhedral oligomeric silsesquioxane (POSS) nanometric molecular structure is doped into neat epoxy. Surface flashover voltage has been tested under DC voltage in SF6 gas. Isothermal surface potential decay (SPD) test were conducted to find out the surface charge characteristics. Quantum chemical calculation was performed to investigate the absolute energy value of Lowest Unoccupied Molecular Orbital (LUMO) level for epoxy/POSS composite, associated to electron affinity for charge carriers. Results specifies that flashover voltage has been positively influenced by both trap energy and trap density of charges. While improved flashover performance of EP/OG-POSS composite compared to EP/ECH-POSS and pristine sample is attributed to deep traps for charges. The energy distribution diagram shows that EP/OG-POSS has higher affinity for charge carrier in EP/OG-POSS comparatively. The affinity for carriers assists the charge trapping centers. Moreover, functional properties of POSS side groups can determine the tailoring of deep trap; moreover, the simulated electronic properties are helpful to understand the improved properties of surface flashover voltage.
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