И.А. Зур, Е.Е. Шманай, Ю. А. Федотова, А. А. Харченко, С. А. Мовчан
{"title":"厚度对硅钻石状碳薄膜电阻率的影响","authors":"И.А. Зур, Е.Е. Шманай, Ю. А. Федотова, А. А. Харченко, С. А. Мовчан","doi":"10.21883/ftt.2023.01.53922.457","DOIUrl":null,"url":null,"abstract":"The relationship between sp^2/sp^3 hybridizations ratio of atomic bonds in diamond-like carbon (DLC) and its electrical resistivity for coatings with a thickness in the range 22-70 nm prepared by vacuum arc deposition on silicon substrate of the SHB-8 brand has been established. It is established, that an increase in the coating thickness from 22 to 70 nm is accompanied by a decrease in the specific transverse electrical resistance of samples from 17 to 2 GOhm·m. This effect is explained by an increase in the proportion of carbon atoms with sp^2 hybridization of electronic orbitals from 86 to 91%, which leads to the appearance of an additional number of π-bonds. A mathematical model, describing the spatial distribution of current when measuring transverse I-V characteristic, has been developed. The results obtained will be useful in creating resistive layers on the electrodes of gas-discharge detectors of charged particle to limit the amount of current in the event of rare spark discharges inside them caused by the registration of random highly ionizing particles.","PeriodicalId":24077,"journal":{"name":"Физика твердого тела","volume":"47 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Влияние толщины на удельное электросопротивление тонких покрытий из алмазоподобного углерода на кремнии\",\"authors\":\"И.А. Зур, Е.Е. Шманай, Ю. А. Федотова, А. А. Харченко, С. А. Мовчан\",\"doi\":\"10.21883/ftt.2023.01.53922.457\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The relationship between sp^2/sp^3 hybridizations ratio of atomic bonds in diamond-like carbon (DLC) and its electrical resistivity for coatings with a thickness in the range 22-70 nm prepared by vacuum arc deposition on silicon substrate of the SHB-8 brand has been established. It is established, that an increase in the coating thickness from 22 to 70 nm is accompanied by a decrease in the specific transverse electrical resistance of samples from 17 to 2 GOhm·m. This effect is explained by an increase in the proportion of carbon atoms with sp^2 hybridization of electronic orbitals from 86 to 91%, which leads to the appearance of an additional number of π-bonds. A mathematical model, describing the spatial distribution of current when measuring transverse I-V characteristic, has been developed. The results obtained will be useful in creating resistive layers on the electrodes of gas-discharge detectors of charged particle to limit the amount of current in the event of rare spark discharges inside them caused by the registration of random highly ionizing particles.\",\"PeriodicalId\":24077,\"journal\":{\"name\":\"Физика твердого тела\",\"volume\":\"47 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Физика твердого тела\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.21883/ftt.2023.01.53922.457\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Физика твердого тела","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21883/ftt.2023.01.53922.457","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Влияние толщины на удельное электросопротивление тонких покрытий из алмазоподобного углерода на кремнии
The relationship between sp^2/sp^3 hybridizations ratio of atomic bonds in diamond-like carbon (DLC) and its electrical resistivity for coatings with a thickness in the range 22-70 nm prepared by vacuum arc deposition on silicon substrate of the SHB-8 brand has been established. It is established, that an increase in the coating thickness from 22 to 70 nm is accompanied by a decrease in the specific transverse electrical resistance of samples from 17 to 2 GOhm·m. This effect is explained by an increase in the proportion of carbon atoms with sp^2 hybridization of electronic orbitals from 86 to 91%, which leads to the appearance of an additional number of π-bonds. A mathematical model, describing the spatial distribution of current when measuring transverse I-V characteristic, has been developed. The results obtained will be useful in creating resistive layers on the electrodes of gas-discharge detectors of charged particle to limit the amount of current in the event of rare spark discharges inside them caused by the registration of random highly ionizing particles.