厚度对硅钻石状碳薄膜电阻率的影响

И.А. Зур, Е.Е. Шманай, Ю. А. Федотова, А. А. Харченко, С. А. Мовчан
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引用次数: 0

摘要

建立了在SHB-8型硅衬底上真空弧沉积制备厚度为22 ~ 70 nm的类金刚石(DLC)涂层的sp^2/sp^3原子键杂化比与电阻率之间的关系。结果表明,当涂层厚度从22 nm增加到70 nm时,样品的比横向电阻从17 GOhm·m降低到2 GOhm·m。这种效应的原因是电子轨道sp^2杂化的碳原子比例从86%增加到91%,从而导致π键的增加。建立了一个数学模型,描述了测量横向I-V特性时电流的空间分布。所得结果将有助于在带电粒子气体放电探测器的电极上建立电阻层,以限制由随机高电离粒子注册引起的罕见火花放电时的电流量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Влияние толщины на удельное электросопротивление тонких покрытий из алмазоподобного углерода на кремнии
The relationship between sp^2/sp^3 hybridizations ratio of atomic bonds in diamond-like carbon (DLC) and its electrical resistivity for coatings with a thickness in the range 22-70 nm prepared by vacuum arc deposition on silicon substrate of the SHB-8 brand has been established. It is established, that an increase in the coating thickness from 22 to 70 nm is accompanied by a decrease in the specific transverse electrical resistance of samples from 17 to 2 GOhm·m. This effect is explained by an increase in the proportion of carbon atoms with sp^2 hybridization of electronic orbitals from 86 to 91%, which leads to the appearance of an additional number of π-bonds. A mathematical model, describing the spatial distribution of current when measuring transverse I-V characteristic, has been developed. The results obtained will be useful in creating resistive layers on the electrodes of gas-discharge detectors of charged particle to limit the amount of current in the event of rare spark discharges inside them caused by the registration of random highly ionizing particles.
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