A2B6单晶中光电电容效应的研究

O. Oliinyk, O. Tsybulskyi, Viktor Sergiychuk, B. Tsyganok
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引用次数: 0

摘要

本文主要研究了A2B6半导体晶体——针状结构的CdS和CdTe单晶中的光电容效应。与现有的由CdS/CdTe制成的薄膜单晶和块状材料不同,上述单晶具有高光导率(Rdark/Rlight = 104或更高)和低载流子寿命(小于1 ms)。该特性允许在金属-半导体接触中创建可变耗尽电容,其值可以通过在接触区域附近产生光电子而减少到几乎为零。得到了矩形脉冲通过cds -铟和cdte -铟结构的实验结果。发现了辐照强度的极限,在此极限之后,耗尽电容与光导晶体内部的扩散容量相比变得微不足道。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Research of the Photocapacitor Effect in A2B6 Monocrystals
This paper is devoted to the research of the photocapacitor effect in A2B6 semiconductor crystals - CdS and CdTe monocrystals with needle structure. Unlike existing thin film monocrystals and bulk materials manufactured from CdS/CdTe, the monocrystals mentioned above have high photoconductivity (Rdark/Rlight = 104 and higher)and low lifetime of charge carriers (less than 1 ms). This feature allowed creating a variable depletion capacitance in the metal-semiconductor contact, its value can be reduced almost to the zero by generating photoelectrons near the contact region. The experimental results of the transmission of rectangular pulses through structures CdS-Indium and CdTe-Indium have been obtained. Irradiation intensity limits has been found, after which the depletion capacitance becomes insignificantly small compared to the diffusion capacity inside the photoconductive crystals.
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