SJTAG/IJTAG环境中的协议需求

G. Carlsson, J. Holmqvist, E. Larsson
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引用次数: 5

摘要

集成电路、印刷电路板和多板系统的测试变得越来越复杂。一个主要的障碍是测试访问,这将通过在测试设备(dut)和测试管理器之间的有效通信标准来缓解。目前,内部联合测试访问组(IJTAG)在微观层面上工作,制定嵌入式芯片上仪器的接口标准,而系统JTAG (SJTAG)在宏观层面上工作,制定系统级测试管理标准,将IJTAG兼容的仪器与系统测试管理器连接起来。本文讨论了在SJTAG/ IJTAG环境中使用的测试协议的需求。我们已经从许多使用场景中进行了分析并定义了协议需求。我们采用了围绕播放器(解释器)构建的标准测试和编程语言(STAPL),并定义了所需的扩展。这些扩展已经在STAPL的扩展版本中实现,我们已经用PC机作为测试控制器,FPGA作为被测设备进行了实验。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Protocol requirements in an SJTAG/IJTAG environment
Integrated circuits, printed circuits boards, and multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/ IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT.
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